Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
2008
78
 
2005
59
 
2002
82
 
1993
55
 
2009
69
 
1995
76
 
Characterization of optical and structural properties of Pt-Si interface by spectroscopic ellipsometry
Proceeding/Conference:Proceedings of the 22nd International Conference on the Physics of Semiconductors, Canada
1994
45
 
1994
62
 
2010
57
 
2007
62
 
2008
55
 
2006
71
 
2004
67
 
2006
61
 
2009
208
 
2009
74
 
2011
61
 
2012
131
 
2004
87
 
1993
56