Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
2008
73
 
2005
55
 
2002
78
 
1993
51
 
2009
63
 
1995
74
 
Characterization of optical and structural properties of Pt-Si interface by spectroscopic ellipsometry
Proceeding/Conference:Proceedings of the 22nd International Conference on the Physics of Semiconductors, Canada
1994
40
 
1994
57
 
2010
52
 
2007
60
 
2008
48
 
2006
63
 
2004
60
 
2006
56
 
2009
203
 
2009
63
 
2011
58
 
2012
127
 
2004
78
 
1993
51