Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
2008
84
 
2005
68
 
2002
101
 
1993
58
 
2009
79
 
1995
92
 
Characterization of optical and structural properties of Pt-Si interface by spectroscopic ellipsometry
Proceeding/Conference:Proceedings of the 22nd International Conference on the Physics of Semiconductors, Canada
1994
45
 
1994
84
 
2010
66
 
2007
62
 
2008
42
 
2006
73
 
2004
73
 
2006
62
 
2009
198
 
2009
 
2011
74
 
2012
157
 
2004
88
 
1993
54