Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
2008
108
 
2005
83
 
2002
91
 
1993
65
 
2009
85
 
1995
87
 
Characterization of optical and structural properties of Pt-Si interface by spectroscopic ellipsometry
Proceeding/Conference:Proceedings of the 22nd International Conference on the Physics of Semiconductors, Canada
1994
56
 
1994
78
 
2010
55
 
2007
79
 
2008
70
 
2006
89
 
2004
90
 
2006
83
 
2009
106
 
2009
103
 
2011
71
 
2012
117
 
2004
108
 
1993
159