Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
2008
118
 
2005
91
 
2002
100
 
1993
72
 
2009
99
 
1995
100
 
Characterization of optical and structural properties of Pt-Si interface by spectroscopic ellipsometry
Proceeding/Conference:Proceedings of the 22nd International Conference on the Physics of Semiconductors, Canada
1994
62
 
1994
91
 
2010
65
 
2007
89
 
2008
78
 
2006
101
 
2004
105
 
2006
95
 
2009
128
 
2009
113
 
2011
83
 
2012
123
 
2004
119
 
1993
169