Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
2008
81
 
2005
62
 
2002
88
 
1993
58
 
2009
72
 
1995
79
 
Characterization of optical and structural properties of Pt-Si interface by spectroscopic ellipsometry
Proceeding/Conference:Proceedings of the 22nd International Conference on the Physics of Semiconductors, Canada
1994
47
 
1994
64
 
2010
59
 
2007
66
 
2008
60
 
2006
74
 
2004
70
 
2006
65
 
2009
214
 
2009
80
 
2011
65
 
2012
135
 
2004
92
 
1993
68