Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
2008
69
 
2005
54
 
2002
74
 
1993
49
 
2009
60
 
1995
69
 
Characterization of optical and structural properties of Pt-Si interface by spectroscopic ellipsometry
Proceeding/Conference:Proceedings of the 22nd International Conference on the Physics of Semiconductors, Canada
1994
39
 
1994
54
 
2010
50
 
2007
47
 
2008
39
 
2006
59
 
2004
55
 
2006
50
 
2009
188
 
2009
62
 
2011
55
 
2012
126
 
2004
71
 
1993
45