Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
2008
74
 
2005
57
 
2002
81
 
1993
52
 
2009
65
 
1995
75
 
Characterization of optical and structural properties of Pt-Si interface by spectroscopic ellipsometry
Proceeding/Conference:Proceedings of the 22nd International Conference on the Physics of Semiconductors, Canada
1994
42
 
1994
59
 
2010
53
 
2007
61
 
2008
50
 
2006
65
 
2004
64
 
2006
59
 
2009
204
 
2009
72
 
2011
60
 
2012
128
 
2004
80
 
1993
53