| Title | Author(s) | Year | View Count |  | Photoresponse from single upright-standing ZnO nanorods explored by photoconductive AFM | Beinik, I; Kratzer, M; Wachauer, A; Wang, L; Piryatinski, YP; Brauer, G; Chen, X; Hsu, YF; Djurisic, A; Teichert, C | 2013 | 5 |
 | On the T2 trap in zinc oxide thin films | Schmidt, M; Ellguth, M; Karsthof, R; v Wenckstern, H; Pickenhain, R; Grundmann, M; Brauer, G; Ling, FCC | 2012 | 91 |
| Erratum: Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005)) | Beinik, I; Kratzer, M; Wachauer, A; Wang, L; Lechner, RT; Teichert, C; Motz, C; Anwand, W; Brauer, G; Chen, XY; Hsu, YF; Djurišić, AB | 2012 | 49 |
 | Emission bands of nitrogen-implantation induced luminescent centers in ZnO crystals: experiment and theory | Dai, XM; Xu, SJ; Ling, CC; Brauer, G; Anwand, W; Skorupa, W | 2012 | 75 |
| Deep level transient spectroscopic study of oxygen implanted melt grown ZnO single crystal | Ye, ZR; Lu, XH; Ding, GW; Fung, S; Ling, CC; Brauer, G; Anwand, W | 2011 | 418 |
| Activities towards p-type doping of ZnO | Brauer, G; Kuriplach, J; Ling, CC; Djurišić, AB | 2011 | 215 |
| Comprehensive study of the p-type conductivity formation in radio frequency magnetron sputtered arsenic-doped ZnO film | Fan, J; Zhu, C; Yang, B; Fung, S; Beling, CD; Brauer, G; Anwand, W; Grambole, D; Skorupa, W; Wong, KS; Zhong, YC; Xie, Z; Ling, CC | 2011 | 205 |
| Ion-implantation induced nano distortion layer and its influence on nonlinear optical properties of ZnO single crystals | Zheng, CC; Xu, SJ; Ning, JQ; Chen, YN; Lu, XH; Ling, CC; Che, CM; Gao, GY; Hao, JH; Brauer, G; Anwand, W | 2011 | 150 |
| Characterization of microstructural defects in melt grown ZnO single crystals | Anwand, W; Brauer, G; Grynszpan, RI; Cowan, TE; Schulz, D; Klimm, D; Iek, J; Kuriplach, J; Prochzka, I; Ling, CC; Djurii, AB; Klemm, V; Schreiber, G; Rafaja, D | 2011 | 696 |
| Electrical properties of ZnO nanorods studied by conductive atomic force microscopy | Beinik, I; Kratzer, M; Wachauer, A; Wang, L; Lechner, RT; Teichert, C; Motz, C; Anwand, W; Brauer, G; Chen, XY; Hsu, XY; Djurišić, AB | 2011 | 105 |
| Shallow acceptor and hydrogen impurity in p-type arsenic-doped ZnMgO films grown by radio frequency magnetron sputtering | Fan, JC; W Ding, G; Fung, S; Xie, Z; Zhong, YC; Wong, KS; Brauer, G; Anwand, W; Grambole, D; Ling, CC | 2010 | 692 |
| Deep level transient spectroscopic study of nitrogen-implanted ZnO single crystal | Ding, G; Ling, CC; Anwand, W; Brauer, G; Skorupa, W | 2010 | 244 |
| Scanning probe microscopy-based characterization of ZnO nanorods | Teichert, C; Hou, Y; Beinik, I; Chen, X; Hsu, YF; Djurišić, AB; Anwand, W; Brauer, G | 2010 | 60 |
| Deep-level defects study of arsenic-implanted ZnO single crystal | Zhu, CY; Ling, CC; Brauer, G; Anwand, W; Skorupa, W | 2009 | 591 |
| Characterization of ZnO nanostructures: A challenge to positron annihilation spectroscopy and other methods | Brauer, G; Anwand, W; Grambole, D; Egger, W; Sperr, P; Beinik, I; Wang, L; Teichert, C; Kuriplach, J; Lang, J; Zviagin, S; Cizmar, E; Ling, CC; Hsu, YF; Xi, YY; Chen, X; Djurišić, AB; Skorupa, W | 2009 | 622 |
| Arsenic doped p -type zinc oxide films grown by radio frequency magnetron sputtering | Fan, JC; Zhu, CY; Fung, S; Zhong, YC; Wong, KS; Xie, Z; Brauer, G; Anwand, W; Skorupa, W; To, CK; Yang, B; Beling, CD; Ling, CC | 2009 | 771 |
| Identification of Zn-vacancy-hydrogen complexes in ZnO single crystals: A challenge to positron annihilation spectroscopy | Brauer, G; Anwand, W; Grambole, D; Grenzer, J; Skorupa, W; Čížek, J; Kuriplach, J; Procházka, I; Ling, CC; So, CK; Schulz, D; Klimm, D | 2009 | 660 |
| Defects in zinc-implanted ZnO thin films | Schmidt, M; Ellguth, M; Czekalla, C; V Wenckstern, H; Pickenhain, R; Grundmann, M; Brauer, G; Skorupa, W; Helm, M; Gu, Q; Ling, CC | 2009 | 610 |
| Defect study in ZnO related structures-A multi-spectroscopic approach | Ling, CC; Cheung, CK; Gu, QL; Dai, XM; Xu, SJ; Zhu, CY; Luo, JM; Zhu, CY; Tam, KH; Djurišić, AB; Beling, CD; Fung, S; Lu, LW; Brauer, G; Anwand, W; Skorupa, W; Ong, HC | 2008 | 529 |
| Defects characterization in ZnO Schottky contact and homogeneous p-n junction | Ling, FCC; Gu, Q; Zhu, C; Hsu, YF; Djurisic, A; Brauer, G; Anwand, W; Skorupa, W | 2008 | 284 |
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