Browsing by Author Fung, KSM

Jump to: 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
Showing results 1 to 20 of 21  next >
TitleAuthor(s)Issue DateViews
 
1995
64
 
An edge-from-focus approach to 3D inspection and metrology
Proceeding/Conference:Proceedings of SPIE
2015
13
 
Automatic Segmentation For Visual Inspection In Semiconductor Manufacturing Using Multiscale Morphology
Proceeding/Conference:7th International Conference on Quality Control by Artificial Vision
2005
52
 
Bit-pairing codification for binary pattern projection system
Proceeding/Conference:Proceedings - International Conference on Pattern Recognition
2006
77
Boundary detection of projected fringes on surface with inhomogeneous reflectance function
Proceeding/Conference:Proceedings of SPIE - The International Society for Optical Engineering
2006
33
An edge detection algorithm based on rectangular gaussian kernels for machine vision applications
Proceeding/Conference:Proceedings of SPIE - The International Society for Optical Engineering
2009
90
An elliptic phase-shifting algorithm for high speed three-dimensional profilometry
Proceeding/Conference:Proceedings of SPIE - The International Society for Optical Engineering
2013
25
 
2008
24
 
Fast measurement of SEP for monitoring spinal cord during scoliosis
Proceeding/Conference:Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings
1998
65
Handling of multi-reflections in wafer bump 3D reconstruction
Proceeding/Conference:Conference Proceedings - IEEE International Conference on Systems, Man and Cybernetics
2008
65
 
Height inspection of wafer bumps without explicit 3-D reconstruction
Journal:IEEE Transactions on Electronics Packaging Manufacturing
2010
33
An illumination-invariant phase-shifting algorithm for three-dimensional profilometry
Proceeding/Conference:Proceedings of SPIE - The International Society for Optical Engineering
2012
55
Intraoperative monitoring of somatosensory evoked potential in the spinal cord rectification operation by means of wavelet analysis
Proceeding/Conference:Proceedings of SPIE - The International Society for Optical Engineering
1998
48
A novel design of grating projection system for 3D reconstruction of wafer bumps
Proceeding/Conference:Proceedings of SPIE - The International Society for Optical Engineering
2006
43
A polynomial phase-shift algorithm for high precision three-dimensional profilometry
Proceeding/Conference:Proceedings of SPIE - The International Society for Optical Engineering
2013
36
 
2008
82
 
Reference-free detection of semiconductor assembly defect
Proceeding/Conference:Proceedings of SPIE - The International Society for Optical Engineering
2005
92
 
2012
79
 
2008
79
 
A three-dimensional imaging system for surface profilometry of moving objects
Proceeding/Conference:IEEE International Workshop on Imaging Systems and Techniques Proceedings
2013
24