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Conference Paper: An edge-from-focus approach to 3D inspection and metrology

TitleAn edge-from-focus approach to 3D inspection and metrology
Authors
Keywords3D metrology
Edge detection
Industrial inspection
Three-dimensional image acquisition
Issue Date2015
PublisherSPIE - International Society for Optical Engineering. The Journal's web site is located at http://spie.org/x1848.xml
Citation
Image Processing: Machine Vision Applications VIII (Conference 9405), San Francisco, CA., 8 February 2015. In Proceedings of SPIE, 2015, v. 9405, article no. 94050E How to Cite?
AbstractWe propose an edge-based depth-from-focus technique for high-precision non-contact industrial inspection and metrology applications. In our system, an objective lens with a large numerical aperture is chosen to resolve the edge details of the measured object. By motorizing this imaging system, we capture the high-resolution edges within every narrow depth of field. We can therefore extend the measured range and keep a high resolution at the same time. Yet, on the surfaces with a large depth variation, a significant amount of data around each measured point are out of focus within the captured images. Then, it is difficult to extract the valuable information from these out-of-focus data due to the depth-variant blur. Moreover, these data impede the extraction of continuous contours for the measurement objects in high-level machine vision applications. The proposed approach however makes use of the out-of-focus data to synthesize a depth-invariant smoothed image, and then robustly locates the positions of high contrast edges based on non-maximum suppression and hysteresis thresholding. Furthermore, by focus analysis of both the in-focus and the out-of-focus data, we reconstruct the high-precision 3D edges for metrology applications.
DescriptionBest Paper Award 2015
Persistent Identifierhttp://hdl.handle.net/10722/211417
ISBN
ISSN
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorDeng, F-
dc.contributor.authorChen, J-
dc.contributor.authorLiu, J-
dc.contributor.authorZhang, Z-
dc.contributor.authorDeng, J-
dc.contributor.authorFung, KSM-
dc.contributor.authorLam, EY-
dc.date.accessioned2015-07-13T03:04:35Z-
dc.date.available2015-07-13T03:04:35Z-
dc.date.issued2015-
dc.identifier.citationImage Processing: Machine Vision Applications VIII (Conference 9405), San Francisco, CA., 8 February 2015. In Proceedings of SPIE, 2015, v. 9405, article no. 94050E-
dc.identifier.isbn978-162841495-0-
dc.identifier.issn0277-786X-
dc.identifier.urihttp://hdl.handle.net/10722/211417-
dc.descriptionBest Paper Award 2015-
dc.description.abstractWe propose an edge-based depth-from-focus technique for high-precision non-contact industrial inspection and metrology applications. In our system, an objective lens with a large numerical aperture is chosen to resolve the edge details of the measured object. By motorizing this imaging system, we capture the high-resolution edges within every narrow depth of field. We can therefore extend the measured range and keep a high resolution at the same time. Yet, on the surfaces with a large depth variation, a significant amount of data around each measured point are out of focus within the captured images. Then, it is difficult to extract the valuable information from these out-of-focus data due to the depth-variant blur. Moreover, these data impede the extraction of continuous contours for the measurement objects in high-level machine vision applications. The proposed approach however makes use of the out-of-focus data to synthesize a depth-invariant smoothed image, and then robustly locates the positions of high contrast edges based on non-maximum suppression and hysteresis thresholding. Furthermore, by focus analysis of both the in-focus and the out-of-focus data, we reconstruct the high-precision 3D edges for metrology applications.-
dc.languageeng-
dc.publisherSPIE - International Society for Optical Engineering. The Journal's web site is located at http://spie.org/x1848.xml-
dc.relation.ispartofProceedings of SPIE-
dc.rightsCopyright 2015 Society of Photo‑Optical Instrumentation Engineers (SPIE). One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this publication for a fee or for commercial purposes, and modification of the contents of the publication are prohibited. This article is available online at https://doi.org/10.1117/12.2074757-
dc.subject3D metrology-
dc.subjectEdge detection-
dc.subjectIndustrial inspection-
dc.subjectThree-dimensional image acquisition-
dc.titleAn edge-from-focus approach to 3D inspection and metrology-
dc.typeConference_Paper-
dc.identifier.emailLam, EY: elam@eee.hku.hk-
dc.identifier.authorityLam, EY=rp00131-
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1117/12.2074757-
dc.identifier.scopuseid_2-s2.0-84926622837-
dc.identifier.hkuros245309-
dc.identifier.volume9405-
dc.identifier.spagearticle no. 94050E-
dc.identifier.epagearticle no. 94050E-
dc.identifier.isiWOS:000353328200010-
dc.publisher.placeUnited States-
dc.customcontrol.immutablesml 150713-

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