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Conference Paper: An edge-from-focus approach to 3D inspection and metrology

TitleAn edge-from-focus approach to 3D inspection and metrology
Authors
Keywords3D metrology
Edge detection
Industrial inspection
Three-dimensional image acquisition
Issue Date2015
PublisherSPIE - International Society for Optical Engineering. The Journal's web site is located at http://spie.org/x1848.xml
Citation
Image Processing: Machine Vision Applications VIII (Conference 9405), San Francisco, CA., 8 February 2015. In Proceedings of SPIE, 2015, v. 9405, article no. 94050E How to Cite?
AbstractWe propose an edge-based depth-from-focus technique for high-precision non-contact industrial inspection and metrology applications. In our system, an objective lens with a large numerical aperture is chosen to resolve the edge details of the measured object. By motorizing this imaging system, we capture the high-resolution edges within every narrow depth of field. We can therefore extend the measured range and keep a high resolution at the same time. Yet, on the surfaces with a large depth variation, a significant amount of data around each measured point are out of focus within the captured images. Then, it is difficult to extract the valuable information from these out-of-focus data due to the depth-variant blur. Moreover, these data impede the extraction of continuous contours for the measurement objects in high-level machine vision applications. The proposed approach however makes use of the out-of-focus data to synthesize a depth-invariant smoothed image, and then robustly locates the positions of high contrast edges based on non-maximum suppression and hysteresis thresholding. Furthermore, by focus analysis of both the in-focus and the out-of-focus data, we reconstruct the high-precision 3D edges for metrology applications.
DescriptionBest Paper Award 2015
Persistent Identifierhttp://hdl.handle.net/10722/211417
ISBN
ISSN

 

DC FieldValueLanguage
dc.contributor.authorDeng, F-
dc.contributor.authorChen, J-
dc.contributor.authorLiu, J-
dc.contributor.authorZhang, Z-
dc.contributor.authorDeng, J-
dc.contributor.authorFung, KSM-
dc.contributor.authorLam, EY-
dc.date.accessioned2015-07-13T03:04:35Z-
dc.date.available2015-07-13T03:04:35Z-
dc.date.issued2015-
dc.identifier.citationImage Processing: Machine Vision Applications VIII (Conference 9405), San Francisco, CA., 8 February 2015. In Proceedings of SPIE, 2015, v. 9405, article no. 94050E-
dc.identifier.isbn978-162841495-0-
dc.identifier.issn0277-786X-
dc.identifier.urihttp://hdl.handle.net/10722/211417-
dc.descriptionBest Paper Award 2015-
dc.description.abstractWe propose an edge-based depth-from-focus technique for high-precision non-contact industrial inspection and metrology applications. In our system, an objective lens with a large numerical aperture is chosen to resolve the edge details of the measured object. By motorizing this imaging system, we capture the high-resolution edges within every narrow depth of field. We can therefore extend the measured range and keep a high resolution at the same time. Yet, on the surfaces with a large depth variation, a significant amount of data around each measured point are out of focus within the captured images. Then, it is difficult to extract the valuable information from these out-of-focus data due to the depth-variant blur. Moreover, these data impede the extraction of continuous contours for the measurement objects in high-level machine vision applications. The proposed approach however makes use of the out-of-focus data to synthesize a depth-invariant smoothed image, and then robustly locates the positions of high contrast edges based on non-maximum suppression and hysteresis thresholding. Furthermore, by focus analysis of both the in-focus and the out-of-focus data, we reconstruct the high-precision 3D edges for metrology applications.-
dc.languageeng-
dc.publisherSPIE - International Society for Optical Engineering. The Journal's web site is located at http://spie.org/x1848.xml-
dc.relation.ispartofProceedings of SPIE-
dc.rightsProceedings of SPIE. Copyright © SPIE - International Society for Optical Engineering.-
dc.rightsCopyright notice format: Copyright 2015 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.-
dc.subject3D metrology-
dc.subjectEdge detection-
dc.subjectIndustrial inspection-
dc.subjectThree-dimensional image acquisition-
dc.titleAn edge-from-focus approach to 3D inspection and metrology-
dc.typeConference_Paper-
dc.identifier.emailLam, EY: elam@eee.hku.hk-
dc.identifier.authorityLam, EY=rp00131-
dc.identifier.doi10.1117/12.2074757-
dc.identifier.scopuseid_2-s2.0-84926622837-
dc.identifier.hkuros245309-
dc.identifier.volume9405-
dc.publisher.placeUnited States-
dc.customcontrol.immutablesml 150713-

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