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Conference Paper: Automatic Segmentation For Visual Inspection In Semiconductor Manufacturing Using Multiscale Morphology

TitleAutomatic Segmentation For Visual Inspection In Semiconductor Manufacturing Using Multiscale Morphology
Authors
Ng, NYLam, EYMChung, RFung, KSMLeung, WH
Issue Date2005
Citation
7th International Conference on Quality Control by Artificial Vision, p. 215-220 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/99652

 

DC FieldValueLanguage
dc.contributor.authorNg, NYen_HK
dc.contributor.authorLam, EYMen_HK
dc.contributor.authorChung, Ren_HK
dc.contributor.authorFung, KSMen_HK
dc.contributor.authorLeung, WHen_HK
dc.date.accessioned2010-09-25T18:38:57Z-
dc.date.available2010-09-25T18:38:57Z-
dc.date.issued2005en_HK
dc.identifier.citation7th International Conference on Quality Control by Artificial Vision, p. 215-220en_HK
dc.identifier.urihttp://hdl.handle.net/10722/99652-
dc.languageengen_HK
dc.relation.ispartof7th International Conference on Quality Control by Artificial Visionen_HK
dc.titleAutomatic Segmentation For Visual Inspection In Semiconductor Manufacturing Using Multiscale Morphologyen_HK
dc.typeConference_Paperen_HK
dc.identifier.emailLam, EYM: elam@eee.hku.hken_HK
dc.identifier.authorityLam, EYM=rp00131en_HK
dc.identifier.hkuros101043en_HK
dc.identifier.spage215en_HK
dc.identifier.epage220en_HK

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