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Conference Paper: An illumination-invariant phase-shifting algorithm for three-dimensional profilometry

TitleAn illumination-invariant phase-shifting algorithm for three-dimensional profilometry
Authors
KeywordsIndustrial Inspection
Surface Measurements
Three-Dimensional Image Acquisition
Issue Date2012
PublisherS P I E - International Society for Optical Engineering. The Journal's web site is located at http://spie.org/x1848.xml
Citation
Proceedings Of SPIE - The International Society For Optical Engineering, 2012, v. 8300 How to Cite?
AbstractUneven illumination is a common problem in real optical systems for machine vision applications, and it contributes significant errors when using phase-shifting algorithms (PSA) to reconstruct the surface of a moving object. Here, we propose an illumination-reflectivity-focus (IRF) model to characterize this uneven illumination effect on phase-measuring profilometry. With this model, we separate the illumination factor effectively, and then formulate the phase reconstruction as an optimization problem. To simplify the optimization process, we calibrate the uneven illumination distribution beforehand, and then use the calibrated illumination information during surface profilometry. After calibration, the degrees of freedom are reduced. Accordingly, we develop a novel illumination-invariant phase-shifting algorithm (II-PSA) to reconstruct the surface of a moving object under an uneven illumination environment. Experimental results show that the proposed algorithm can improve the reconstruction quality both visually and numerically. Therefore, using this IRF model and the corresponding II-PSA, not only can we handle uneven illumination in a real optical system with a large field of view (FOV), but we also develop a robust and efficient method for reconstructing the surface of a moving object. © 2012 Copyright Society of Photo-Optical Instrumentation Engineers (SPIE).
DescriptionImage Processing: Machine Vision Applications V, Burlingame, California, USA, 22 January, 2012
Persistent Identifierhttp://hdl.handle.net/10722/158783
ISSN
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorDeng, Fen_US
dc.contributor.authorLiu, Cen_US
dc.contributor.authorSze, Wen_US
dc.contributor.authorDeng, Jen_US
dc.contributor.authorFung, KSMen_US
dc.contributor.authorLeung, WHen_US
dc.contributor.authorLam, EYen_US
dc.date.accessioned2012-08-08T09:01:18Z-
dc.date.available2012-08-08T09:01:18Z-
dc.date.issued2012en_US
dc.identifier.citationProceedings Of SPIE - The International Society For Optical Engineering, 2012, v. 8300en_US
dc.identifier.issn0277-786Xen_US
dc.identifier.urihttp://hdl.handle.net/10722/158783-
dc.descriptionImage Processing: Machine Vision Applications V, Burlingame, California, USA, 22 January, 2012-
dc.description.abstractUneven illumination is a common problem in real optical systems for machine vision applications, and it contributes significant errors when using phase-shifting algorithms (PSA) to reconstruct the surface of a moving object. Here, we propose an illumination-reflectivity-focus (IRF) model to characterize this uneven illumination effect on phase-measuring profilometry. With this model, we separate the illumination factor effectively, and then formulate the phase reconstruction as an optimization problem. To simplify the optimization process, we calibrate the uneven illumination distribution beforehand, and then use the calibrated illumination information during surface profilometry. After calibration, the degrees of freedom are reduced. Accordingly, we develop a novel illumination-invariant phase-shifting algorithm (II-PSA) to reconstruct the surface of a moving object under an uneven illumination environment. Experimental results show that the proposed algorithm can improve the reconstruction quality both visually and numerically. Therefore, using this IRF model and the corresponding II-PSA, not only can we handle uneven illumination in a real optical system with a large field of view (FOV), but we also develop a robust and efficient method for reconstructing the surface of a moving object. © 2012 Copyright Society of Photo-Optical Instrumentation Engineers (SPIE).en_US
dc.languageengen_US
dc.publisherS P I E - International Society for Optical Engineering. The Journal's web site is located at http://spie.org/x1848.xmlen_US
dc.relation.ispartofProceedings of SPIE - The International Society for Optical Engineeringen_US
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License-
dc.subjectIndustrial Inspectionen_US
dc.subjectSurface Measurementsen_US
dc.subjectThree-Dimensional Image Acquisitionen_US
dc.titleAn illumination-invariant phase-shifting algorithm for three-dimensional profilometryen_US
dc.typeConference_Paperen_US
dc.identifier.emailLam, EY:elam@eee.hku.hken_US
dc.identifier.authorityLam, EY=rp00131en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1117/12.911113en_US
dc.identifier.scopuseid_2-s2.0-84859448434en_US
dc.identifier.hkuros220481-
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-84859448434&selection=ref&src=s&origin=recordpageen_US
dc.identifier.volume8300en_US
dc.identifier.isiWOS:000304865800004-
dc.publisher.placeUnited Statesen_US
dc.identifier.scopusauthoridDeng, F=35619947800en_US
dc.identifier.scopusauthoridLiu, C=55176759200en_US
dc.identifier.scopusauthoridSze, W=54891738600en_US
dc.identifier.scopusauthoridDeng, J=35620061100en_US
dc.identifier.scopusauthoridFung, KSM=8627247700en_US
dc.identifier.scopusauthoridLeung, WH=36956842400en_US
dc.identifier.scopusauthoridLam, EY=7102890004en_US

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