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Conference Paper: A three-dimensional imaging system for surface profilometry of moving objects

TitleA three-dimensional imaging system for surface profilometry of moving objects
Authors
KeywordsIndustrial inspection
Profilometry
Surface measurement
Three-dimensional image acquisition
Issue Date2013
PublisherIEEE. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1001148
Citation
The 2013 IEEE International Conference on Imaging Systems and Techniques (IST 2013), Beijing, China, 22-23 October 2013. In Conference Proceedings, 2013, p. 343-347 How to Cite?
AbstractNon-contact optical imaging system design and the corresponding surface profilometry algorithm are critical components in various metrology applications, such as surface inspection of semiconductor components on the production line. For such challenging industrial applications, the most important considerations are often automation, precision and speed of the inspection. In this work, we propose a mathematical framework and a dynamic phase-shift algorithm (D-PSA) for a dense surface profilometry of moving objects. We also present a fringe pattern projection system with projector and camera arrays, with an aim to reduce the undesirable effects such as the uneven illumination and the perspective geometry effect on the reconstructed surface using a large field-of-view inspection system. This system is then applied to the inspection of the surface of moving printed circuit boards along a conveyor belt. Experimental results show that our approach can reconstruct the object surface effectively and efficiently. © 2013 IEEE.
Persistent Identifierhttp://hdl.handle.net/10722/201231
ISBN

 

DC FieldValueLanguage
dc.contributor.authorDeng, Fen_US
dc.contributor.authorLiu, Jen_US
dc.contributor.authorDeng, Jen_US
dc.contributor.authorFung, KSMen_US
dc.contributor.authorLam, EYen_US
dc.date.accessioned2014-08-21T07:18:17Z-
dc.date.available2014-08-21T07:18:17Z-
dc.date.issued2013en_US
dc.identifier.citationThe 2013 IEEE International Conference on Imaging Systems and Techniques (IST 2013), Beijing, China, 22-23 October 2013. In Conference Proceedings, 2013, p. 343-347en_US
dc.identifier.isbn978-1-4673-5791-3-
dc.identifier.urihttp://hdl.handle.net/10722/201231-
dc.description.abstractNon-contact optical imaging system design and the corresponding surface profilometry algorithm are critical components in various metrology applications, such as surface inspection of semiconductor components on the production line. For such challenging industrial applications, the most important considerations are often automation, precision and speed of the inspection. In this work, we propose a mathematical framework and a dynamic phase-shift algorithm (D-PSA) for a dense surface profilometry of moving objects. We also present a fringe pattern projection system with projector and camera arrays, with an aim to reduce the undesirable effects such as the uneven illumination and the perspective geometry effect on the reconstructed surface using a large field-of-view inspection system. This system is then applied to the inspection of the surface of moving printed circuit boards along a conveyor belt. Experimental results show that our approach can reconstruct the object surface effectively and efficiently. © 2013 IEEE.-
dc.languageengen_US
dc.publisherIEEE. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1001148-
dc.relation.ispartofIEEE International Workshop on Imaging Systems and Techniques Proceedingsen_US
dc.rightsIEEE International Workshop on Imaging Systems and Techniques. Copyright © IEEE.-
dc.rights©2013 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.-
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License-
dc.subjectIndustrial inspection-
dc.subjectProfilometry-
dc.subjectSurface measurement-
dc.subjectThree-dimensional image acquisition-
dc.titleA three-dimensional imaging system for surface profilometry of moving objectsen_US
dc.typeConference_Paperen_US
dc.identifier.emailLam, EY: elam@eee.hku.hken_US
dc.identifier.authorityLam, EY=rp00131en_US
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1109/IST.2013.6729718-
dc.identifier.scopuseid_2-s2.0-84894434503-
dc.identifier.hkuros233704en_US
dc.identifier.spage343-
dc.identifier.epage347-
dc.publisher.placeUnited States-
dc.customcontrol.immutablesml 140826-

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