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Showing results 26 to 45 of 87 < previous next >

Title	Author(s)	Issue Date	Views
Effect of heat diffusion during state transitions in resistive switching memory device based on nickel-rich nickel oxide film Journal:IEEE Transactions on Electron Devices	Hu, SG Liu, Y Chen, TP Liu, Z Yang, M Yu, Q Fung, S	2012	141
The effect of the temperature dependence of the ideality factor on metal-semiconductor solar devices Journal:Semiconductor Science and Technology	Lee, TC Chen, TP Au, HL Fung, S Beling, CD	1993	105
Electrical characteristics of Si nanocrystal distributed in a narrow layer in the gate oxide near the gate synthesized with very-low-energy ion beams Journal:Journal of Applied Physics	Ng, CY Chen, TP Zhao, P Ding, L Liu, Y Tseng, AA Fung, S	2006	193
Electrically induced room temperature metastability in semi-insulating GaAs Journal:Solid State Communications	Fung, S Luo, YL Beling, CD Chen, TP	1998	185
Energy shifts of Si oxidation states in the system of Si nanocrystals embedded in SiO 2 matrix Journal:Journal of Nanoscience and Nanotechnology	Chen, TP Liu, Y Sun, CQ Tseng, AA Fung, S	2007	43
Evolution of electroluminescence from multiple Si-implanted silicon nitride films with thermal annealing Journal:Journal of Applied Physics	Cen, ZH Chen, TP Ding, L Liu, Y Wong, JI Yang, M Liu, Z Goh, WP Zhu, FR Fung, S	2009	166
Evolution of photoluminescence mechanisms of Si +-implanted SiO 2 films with thermal annealing Journal:Journal of Nanoscience and Nanotechnology	Ding, L Chen, TP Liu, Y Ng, CY Yang, M Wong, JI Zhu, FR Tan, MC Fung, S Chen, XD Huang, Y	2008	82
Fermi level position at metal/semi-insulating - GaAs (1 0 0) interfaces studied by photoelectric techniques Journal:Solid State Communications	Chen, TP Luo, YL Fung, S Beling, CD	1997	61
Flexible write-once-read-many-times memory device based on a nickel oxide thin film Journal:IEEE Transactions on Electron Devices	Yu, Q Liu, Y Chen, TP Liu, Z Yu, YF Lei, HW Zhu, J Fung, S	2012	114
Influence of annealing on Fermi-level pinning and current transport at Au-Si and Au-GaAs Interfaces Journal:Journal of Applied Physics	Chen, TP Liu, YC Fung, S Beling, CD	1995	140
Influence of charge trapping on electroluminescence from Si-nanocrystal light emitting structure Journal:Journal of Applied Physics	Liu, Y Chen, TP Ding, L Yang, M Wong, JI Ng, CY Yu, SF Li, ZX Yuen, C Zhu, FR Tan, MC Fung, S	2007	185
Influence of implantation dose on electroluminescence from Si-implanted silicon nitride thin films Journal:Applied Physics A: Materials Science and Processing	Cen, ZH Chen, TP Ding, L Liu, Z Wong, JI Yang, M Goh, WP Fung, S	2011	186
Influence of interfacial nitrogen on edge charge trapping at the interface of gate oxide/drain extension in metal-oxide-semiconductor transistors Journal:Applied Physics Letters	Chen, TP Huang, JY Tse, MS Tan, SS Ang, CH Fung, S	2003	164
Influence of nanocrystal size on optical properties of Si nanocrystals embedded in Si O2 synthesized by Si ion implantation Journal:Journal of Applied Physics	Ding, L Chen, TP Liu, Y Yang, M Wong, JI Liu, YC Trigg, AD Zhu, FR Tan, MC Fung, S	2007	63
Influence of nitrogen on tunneling barrier heights and effective masses of electrons and holes at lightly-nitrided SiO2/Si interface Journal:Journal of Applied Physics	Ng, CY Chen, TP Liu, Y Sun, CQ Fung, S	2004	126
Influence of Si nanocrystal distributed in the gate oxide on the MOS capacitance Journal:IEEE Transactions on Electron Devices	Ng, CY Chen, TP Ding, L Yang, M Wong, JI Zhao, P Yang, XH Liu, KY Tse, MS Trigg, AD Fung, S	2006	121
Influence of Si-nanocrystal distribution in the oxide on the charging behavior of MOS structures Journal:IEEE Transactions on Electron Devices	Liu, Y Chen, TP Ng, CY Ding, L Tse, MS Fung, S Tseng, AA	2006	147
Influence of silicon-nanocrystal distribution in SiO2 matrix on charge injection and charge decay Journal:Applied Physics Letters	Ng, CY Chen, TP Tse, MS Lim, VSW Fung, S Tseng, AA	2005	177
The influence of the implantation dose and energy on the electroluminescence of Si +-implanted amorphous SiO 2 thin films Journal:Nanotechnology	Ding, L Chen, TP Liu, Y Yang, M Wong, JI Liu, KY Zhu, FR Fung, S	2007	69
Instabilities in gate-controlled-diode characteristics of n-MOSFETs following hot-carrier injection Journal:Semiconductor Science and Technology	Chen, TP Lo, KF Fung, S	1997	165

Showing results 26 to 45 of 87 < previous next >