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Browsing by Author rp00197
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Showing results 1 to 20 of 109
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Title
Author(s)
Issue Date
1/f noise behaviors of NO-nitrided n-MOSFETs
Journal:
Solid-State Electronics
Xu, JP
Lai, PT
Cheng, YC
2001
1/f noise in n-channel metal-oxide-semiconductor field-effect transistors under different hot-carrier stresses
Journal:
Journal of Applied Physics
Xu, JP
Lai, PT
Cheng, YC
1999
A 2-D threshold-voltage model for small MOSFET with quantum-mechanical effects
Proceeding/Conference:
2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC
Xu, JP
Li, YP
Lai, PT
Chen, WB
Xu, SG
2006
A 2D threshold-voltage model for small MOSFET with quantum-mechanical effects
Journal:
Microelectronics Reliability
Xu, JP
Li, YP
Lai, PT
Chen, WB
Xu, SG
Guan, JG
2008
Analysis on accuracy of charge-pumping measurement with gate sawtooth pulses
Journal:
IEEE Transactions on Electron Devices
Lai, PT
Xu, JP
Poek, CK
Cheng, YC
1998
Analysis on hydrogen-sensitive characteristics of Schottky sensor with N2O-grown oxynitride as gate insulator
Journal:
Chinese Journal of Sensors and Actuators
Han, B
Xu, JP
Lai, PT
Li, YP
2004
An analysis on stress-induced degradation of 1/f noise in n-MOSFETs
Proceeding/Conference:
Proceedings of 15th International Conference Noise in Physical Systems and 1/f Fluctuations
Lai, PT
Xu, J
Cheng, YC
1999
A carrier-mobility model for high-k gate-dielectric Ge MOSFETs with metal gate electrode
Journal:
Microelectronics Reliability
Xu, JP
Xiao, X
Lai, PT
2010
A compact threshold-voltage model of MOSFETs with stack high-k gate dielectric
Proceeding/Conference:
2009 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2009
Ji, F
Xu, JP
Chen, JJ
Xu, HX
Li, CX
Lai, PT
2009
Comparative study of HfTa-based gate-dielectric Ge metal-oxide- semiconductor capacitors with and without AlON interlayer
Journal:
Applied Physics A: Materials Science and Processing
Xu, JP
Zhang, XF
Li, CX
Chan, CL
Lai, PT
2010
A comparison between NO-annealed O2- and N2O-grown gate dielectrics
Proceeding/Conference:
IEEE Hong Kong Electron Devices Meeting Proceedings
Lai, PT
Xu, JP
Cheng, YC
1998
Comparison between TaON/SiO2 and HfON/SiO2 as dual tunnel layer in charge-trapping flash memory applications
Proceeding/Conference:
I E E E Conference on Electron Devices and Solid-State Circuits Proceedings
Chen, J
Xu, J
Liu, L
Xu, HX
Lai, PT
2012
A comparison between the interface properties of N2O-nitrided and N2O-grown oxides
Journal:
Solid-State Electronics
Xu, JP
Lai, PT
Cheng, YC
1998
Determination of optimal insulator thickness for MISiC hydrogen sensors
Proceeding/Conference:
Solid-State Electronics
Xu, JP
Lai, PT
Han, B
Tang, WM
2004
Dynamic-stress-induced enhanced degradation of 1/f noise in n-MOSFET's
Journal:
IEEE Transactions on Electron Devices
Xu, JP
Lai, PT
Cheng, YC
2000
Effect of interface-roughness scattering on mobility degradation in SiGe p-MOSFETs with a high-k dielectric/SiO2 gate stack
Journal:
Chinese Physics
Zhang, XF
Xu, JP
Lai, PT
Li, CX
Guan, JG
2007
Effect of SiO2/SiC interface on inversion channel electron mobility of 4H-SiC n-MOSFET
Journal:
Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors
Xu, J
Wu, H
Lai, PT
Han, B
2004
Effects of annealing gas species on the electrical properties and reliability of Ge MOS capacitors with high-k Y 2O 3 gate dielectric
Proceeding/Conference:
2009 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2009
Li, CX
Xu, HX
Xu, JP
Lai, PT
2009
The effects of duty cycle and voltage swing of gate pulse on the AC-stress-induced degradation of nMOSFETs with N2O gate oxides
Journal:
Microelectronics Reliability
Zeng, X
Lai, PT
Xu, JP
1998
Effects of fluorine incorporation on the properties of Ge p-MOS capacitors with HfTiON dielectric
Journal:
Solid-State Electronics
Li, CX
Leung, CH
Lai, PT
Xu, JP
2010