Browsing by Author Cheng, YC

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TitleAuthor(s)Issue DateViews
 
1/f noise behaviors of NO-nitrided n-MOSFETs
Journal:Solid-State Electronics
2001
112
 
1999
238
 
1998
39
 
An analysis on stress-induced degradation of 1/f noise in n-MOSFETs
Proceeding/Conference:Proceedings of 15th International Conference Noise in Physical Systems and 1/f Fluctuations
1999
35
 
1984
48
 
1984
33
 
2012
86
 
2006
67
 
2008
79
 
2009
73
 
Characterisation and simulation of substrate current in thermally reoxidised-nitrided-oxide n-MOSFET's
Proceeding/Conference:International Semiconductor Device Research Symposium, ISDRS-91
1991
38
 
1990
44
 
1990
81
 
2000
133
 
2002
90
 
1994
72
 
1985
50
 
A comparison between NO-annealed O2- and N2O-grown gate dielectrics
Proceeding/Conference:IEEE Hong Kong Electron Devices Meeting Proceedings
1998
76
 
1998
46
 
Computer simulation of rapid thermal annealing of thermally grown oxide in ammonia ambient
Proceeding/Conference:Techical Digest of 1989 International Conference on VLSI and CAD (ICVC '89)
1989
42