| Title | Author(s) | Year | View Count |
 | Erratum: Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005)) | Beinik, I; Kratzer, M; Wachauer, A; Wang, L; Lechner, RT; Teichert, C; Motz, C; Anwand, W; Brauer, G; Chen, XY; Hsu, YF; Djurišić, AB | 2012 | 45 |
 | Emission bands of nitrogen-implantation induced luminescent centers in ZnO crystals: experiment and theory | Dai, XM; Xu, SJ; Ling, CC; Brauer, G; Anwand, W; Skorupa, W | 2012 | 68 |
| Deep level transient spectroscopic study of oxygen implanted melt grown ZnO single crystal | Ye, ZR; Lu, XH; Ding, GW; Fung, S; Ling, CC; Brauer, G; Anwand, W | 2011 | 413 |
| Characterization of microstructural defects in melt grown ZnO single crystals | Anwand, W; Brauer, G; Grynszpan, RI; Cowan, TE; Schulz, D; Klimm, D; Iek, J; Kuriplach, J; Prochzka, I; Ling, CC; Djurii, AB; Klemm, V; Schreiber, G; Rafaja, D | 2011 | 684 |
| Electrical properties of ZnO nanorods studied by conductive atomic force microscopy | Beinik, I; Kratzer, M; Wachauer, A; Wang, L; Lechner, RT; Teichert, C; Motz, C; Anwand, W; Brauer, G; Chen, XY; Hsu, XY; Djurišić, AB | 2011 | 90 |
| Ion-implantation induced nano distortion layer and its influence on nonlinear optical properties of ZnO single crystals | Zheng, CC; Xu, SJ; Ning, JQ; Chen, YN; Lu, XH; Ling, CC; Che, CM; Gao, GY; Hao, JH; Brauer, G; Anwand, W | 2011 | 139 |
| Comprehensive study of the p-type conductivity formation in radio frequency magnetron sputtered arsenic-doped ZnO film | Fan, J; Zhu, C; Yang, B; Fung, S; Beling, CD; Brauer, G; Anwand, W; Grambole, D; Skorupa, W; Wong, KS; Zhong, YC; Xie, Z; Ling, CC | 2011 | 194 |
| Shallow acceptor and hydrogen impurity in p-type arsenic-doped ZnMgO films grown by radio frequency magnetron sputtering | Fan, JC; W Ding, G; Fung, S; Xie, Z; Zhong, YC; Wong, KS; Brauer, G; Anwand, W; Grambole, D; Ling, CC | 2010 | 684 |
| Scanning probe microscopy-based characterization of ZnO nanorods | Teichert, C; Hou, Y; Beinik, I; Chen, X; Hsu, YF; Djurišić, AB; Anwand, W; Brauer, G | 2010 | 49 |
 | Deep level transient spectroscopic study of nitrogen-implanted ZnO single crystal | Ding, G; Ling, CC; Anwand, W; Brauer, G; Skorupa, W | 2010 | 237 |
| Identification of Zn-vacancy-hydrogen complexes in ZnO single crystals: A challenge to positron annihilation spectroscopy | Brauer, G; Anwand, W; Grambole, D; Grenzer, J; Skorupa, W; Čížek, J; Kuriplach, J; Procházka, I; Ling, CC; So, CK; Schulz, D; Klimm, D | 2009 | 649 |
| Deep-level defects study of arsenic-implanted ZnO single crystal | Zhu, CY; Ling, CC; Brauer, G; Anwand, W; Skorupa, W | 2009 | 583 |
| Arsenic doped p -type zinc oxide films grown by radio frequency magnetron sputtering | Fan, JC; Zhu, CY; Fung, S; Zhong, YC; Wong, KS; Xie, Z; Brauer, G; Anwand, W; Skorupa, W; To, CK; Yang, B; Beling, CD; Ling, CC | 2009 | 761 |
| Characterization of ZnO nanostructures: A challenge to positron annihilation spectroscopy and other methods | Brauer, G; Anwand, W; Grambole, D; Egger, W; Sperr, P; Beinik, I; Wang, L; Teichert, C; Kuriplach, J; Lang, J; Zviagin, S; Cizmar, E; Ling, CC; Hsu, YF; Xi, YY; Chen, X; Djurišić, AB; Skorupa, W | 2009 | 610 |
| Influence of electron irradiation on hydrothermally grown zinc oxide single crystals | Lu, LW; So, CK; Zhu, CY; Gu, QL; Li, CJ; Fung, S; Brauer, G; Anwand, W; Skorupa, W; Ling, CC | 2008 | 566 |
| Vacancy-type defects in 6H-silicon carbide induced by He-implantation: A positron annihilation spectroscopy approach | Zhu, CY; Ling, CC; Brauer, G; Anwand, W; Skorupa, W | 2008 | 597 |
| Defect study in ZnO related structures-A multi-spectroscopic approach | Ling, CC; Cheung, CK; Gu, QL; Dai, XM; Xu, SJ; Zhu, CY; Luo, JM; Zhu, CY; Tam, KH; Djurišić, AB; Beling, CD; Fung, S; Lu, LW; Brauer, G; Anwand, W; Skorupa, W; Ong, HC | 2008 | 518 |
| Defect study in zinc oxide related structures – Electrical and optical characterization | Gu, Q; Ling, FCC; Cheung, CK; Dai, X; Xu, SJ; Tam, KH; Djurisic, A; Wang, RS; Ong, HC; Brauer, G; Anwand, W; Skorupa, W | 2008 | 218 |
| Non-destructive characterization of vertical ZnO nanorod arrays by slow positron implantation spectroscopy, atomic force microscopy, and photoluminescence | Brauer, G; Anwand, W; Skorupa, W; Beynik, I; Teichert, C; Hsu, YF; Xi, Y; Zhu, C; Ling, FCC; Djurisic, A | 2008 | 249 |
| Deep level defect study of As-implanted ZnO p-n junction | Zhu, C; Ling, FCC; Brauer, G; Anwand, W; Skorupa, W | 2008 | 194 |
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