Article: Defect study in ZnO related structures-A multi-spectroscopic approach

File Download Links for fulltext
(May Require Subscription)
Supplementary
  • Basic View
  • Metadata View
  • XML View
TitleDefect study in ZnO related structures-A multi-spectroscopic approach
AuthorsLing, CC1
Cheung, CK1
Gu, QL1
Dai, XM1
Xu, SJ1
Zhu, CY1
Luo, JM1
Zhu, CY1
Tam, KH1
Djurišić, AB1
Beling, CD1
Fung, S1
Lu, LW1
Brauer, G2
Anwand, W2
Skorupa, W2
Ong, HC3
KeywordsDLTS
Nanorod
PAS
PL
Schottky contact
XPS
ZnO
Issue Date2008
PublisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/apsusc
CitationApplied Surface Science, 2008, v. 255 n. 1, p. 58-62 [How to Cite?]
DOI: http://dx.doi.org/10.1016/j.apsusc.2008.05.309
AbstractZnO has attracted a great deal of attention in recent years because of its potential applications for fabricating optoelectronic devices. Using a multi-spectroscopic approach including positron annihilation spectroscopy (PAS), deep level transient spectroscopy (DLTS), photoluminescence (PL) and X-ray photoelectron spectroscopy (XPS), we have studied the two observed phenomena from ZnO related structures. They namely included the H 2O 2 pre-treatment induced ohmic to rectifying contact conversion on Au/n-ZnO contact and the p-type doping by nitrogen ion implantation. The aim of the studies was to offering comprehensive views as to how the defects influenced the structures electrical and optical properties of the structures. It was also shown that PAS measurement using the monoenergetic positron beam could offer valuable information of vacancy type defects in the vertical ZnO nanorod array structure. © 2008 Elsevier B.V. All rights reserved.
ISSN0169-4332
2011 Impact Factor: 2.103
2011 SCImago Journal Rankings: 0.156
DOIhttp://dx.doi.org/10.1016/j.apsusc.2008.05.309
ISI Accession Number IDWOS:000259726900014
ReferencesReferences in Scopus
DC Field
Value
dc.contributor.authorLing, CC
dc.contributor.authorCheung, CK
dc.contributor.authorGu, QL
dc.contributor.authorDai, XM
dc.contributor.authorXu, SJ
dc.contributor.authorZhu, CY
dc.contributor.authorLuo, JM
dc.contributor.authorZhu, CY
dc.contributor.authorTam, KH
dc.contributor.authorDjurišić, AB
dc.contributor.authorBeling, CD
dc.contributor.authorFung, S
dc.contributor.authorLu, LW
dc.contributor.authorBrauer, G
dc.contributor.authorAnwand, W
dc.contributor.authorSkorupa, W
dc.contributor.authorOng, HC
dc.date.accessioned2010-05-31T03:52:52Z
dc.date.available2010-05-31T03:52:52Z
dc.date.issued2008
dc.description.abstractZnO has attracted a great deal of attention in recent years because of its potential applications for fabricating optoelectronic devices. Using a multi-spectroscopic approach including positron annihilation spectroscopy (PAS), deep level transient spectroscopy (DLTS), photoluminescence (PL) and X-ray photoelectron spectroscopy (XPS), we have studied the two observed phenomena from ZnO related structures. They namely included the H 2O 2 pre-treatment induced ohmic to rectifying contact conversion on Au/n-ZnO contact and the p-type doping by nitrogen ion implantation. The aim of the studies was to offering comprehensive views as to how the defects influenced the structures electrical and optical properties of the structures. It was also shown that PAS measurement using the monoenergetic positron beam could offer valuable information of vacancy type defects in the vertical ZnO nanorod array structure. © 2008 Elsevier B.V. All rights reserved.
dc.description.natureLink_to_subscribed_fulltext
dc.identifier.citationApplied Surface Science, 2008, v. 255 n. 1, p. 58-62 [How to Cite?]
DOI: http://dx.doi.org/10.1016/j.apsusc.2008.05.309
dc.identifier.doihttp://dx.doi.org/10.1016/j.apsusc.2008.05.309
dc.identifier.epage62
dc.identifier.hkuros153531
dc.identifier.isiWOS:000259726900014
dc.identifier.issn0169-4332
2011 Impact Factor: 2.103
2011 SCImago Journal Rankings: 0.156
dc.identifier.issue1
dc.identifier.openurl
dc.identifier.scopuseid_2-s2.0-53049096067
dc.identifier.spage58
dc.identifier.urihttp://hdl.handle.net/10722/59564
dc.identifier.volume255
dc.languageeng
dc.publisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/apsusc
dc.publisher.placeNetherlands
dc.relation.ispartofApplied Surface Science
dc.relation.referencesReferences in Scopus
dc.rightsApplied Surface Science. Copyright © Elsevier BV.
dc.subjectDLTS
dc.subjectNanorod
dc.subjectPAS
dc.subjectPL
dc.subjectSchottky contact
dc.subjectXPS
dc.subjectZnO
dc.titleDefect study in ZnO related structures-A multi-spectroscopic approach
dc.typeArticle
Author Affiliations
  1. The University of Hong Kong
  2. Forschungszentrum Dresden Rossendorf
  3. Chinese University of Hong Kong