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Conference Paper: Defect study in zinc oxide related structures – Electrical and optical characterization
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TitleDefect study in zinc oxide related structures – Electrical and optical characterization
 
AuthorsGu, Q
Ling, FCC
Cheung, CK
Dai, X
Xu, SJ
Tam, KH
Djurisic, A
Wang, RS
Ong, HC
Brauer, G
Anwand, W
Skorupa, W
 
Issue Date2008
 
DC FieldValue
dc.contributor.authorGu, Q
 
dc.contributor.authorLing, FCC
 
dc.contributor.authorCheung, CK
 
dc.contributor.authorDai, X
 
dc.contributor.authorXu, SJ
 
dc.contributor.authorTam, KH
 
dc.contributor.authorDjurisic, A
 
dc.contributor.authorWang, RS
 
dc.contributor.authorOng, HC
 
dc.contributor.authorBrauer, G
 
dc.contributor.authorAnwand, W
 
dc.contributor.authorSkorupa, W
 
dc.date.accessioned2010-09-26T01:36:08Z
 
dc.date.available2010-09-26T01:36:08Z
 
dc.date.issued2008
 
dc.identifier.hkuros152382
 
dc.identifier.urihttp://hdl.handle.net/10722/109761
 
dc.languageeng
 
dc.relation.ispartofMRS International Materials Research Conference, June 9-12, 2008
 
dc.titleDefect study in zinc oxide related structures – Electrical and optical characterization
 
dc.typeConference_Paper
 
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<contributor.author>Ling, FCC</contributor.author>
<contributor.author>Cheung, CK</contributor.author>
<contributor.author>Dai, X</contributor.author>
<contributor.author>Xu, SJ</contributor.author>
<contributor.author>Tam, KH</contributor.author>
<contributor.author>Djurisic, A</contributor.author>
<contributor.author>Wang, RS</contributor.author>
<contributor.author>Ong, HC</contributor.author>
<contributor.author>Brauer, G</contributor.author>
<contributor.author>Anwand, W</contributor.author>
<contributor.author>Skorupa, W</contributor.author>
<date.accessioned>2010-09-26T01:36:08Z</date.accessioned>
<date.available>2010-09-26T01:36:08Z</date.available>
<date.issued>2008</date.issued>
<identifier.uri>http://hdl.handle.net/10722/109761</identifier.uri>
<language>eng</language>
<relation.ispartof>MRS International Materials Research Conference, June 9-12, 2008</relation.ispartof>
<title>Defect study in zinc oxide related structures &#8211; Electrical and optical characterization</title>
<type>Conference_Paper</type>
<identifier.hkuros>152382</identifier.hkuros>
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