Browsing by Author Tse, MS

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TitleAuthor(s)Issue DateViews
 
2004
73
 
2004
88
 
2003
72
 
2003
63
 
2003
82
 
2006
70
 
2006
73
 
2005
77
 
2001
66
 
2001
44
 
Post-breakdown conduction instability of ultrathin SiO 2 films observed in ramped-current and ramped-voltage current-voltage measurements
Journal:Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
2002
51
 
2004
238
 
2005
72
 
1994
96
 
2001
72
 
2006
95