Browsing by Author Tse, MS

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TitleAuthor(s)Issue DateViews
 
2004
69
 
2004
90
 
2003
66
 
2003
61
 
2003
73
 
2006
54
 
2006
71
 
2005
66
 
2001
66
 
2001
47
 
Post-breakdown conduction instability of ultrathin SiO 2 films observed in ramped-current and ramped-voltage current-voltage measurements
Journal:Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
2002
52
 
2004
112
 
2005
75
 
1994
103
 
2001
73
 
2006
89