Browsing by Author Tse, MS

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Showing results 1 to 16 of 16
TitleAuthor(s)Issue DateViews
 
2004
90
 
2004
108
 
2003
76
 
2003
75
 
2003
85
 
2006
62
 
2006
77
 
2005
77
 
2001
65
 
2001
62
 
Post-breakdown conduction instability of ultrathin SiO 2 films observed in ramped-current and ramped-voltage current-voltage measurements
Journal:Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
2002
61
 
2004
116
 
2005
106
 
1994
138
 
2001
95
 
2006
101