Browsing by Author Tse, MS

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TitleAuthor(s)Issue DateViews
 
2004
55
 
2004
71
 
2003
52
 
2003
54
 
2003
62
 
2006
47
 
2006
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2005
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2001
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Post-breakdown conduction instability of ultrathin SiO 2 films observed in ramped-current and ramped-voltage current-voltage measurements
Journal:Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
2002
45
 
2004
99
 
2005
59
 
1994
81
 
2001
61
 
2006
65