Browsing by Author Tse, MS

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TitleAuthor(s)Issue DateViews
 
2004
63
 
2004
80
 
2003
61
 
2003
57
 
2003
68
 
2006
50
 
2006
66
 
2005
61
 
2001
64
 
2001
45
 
Post-breakdown conduction instability of ultrathin SiO 2 films observed in ramped-current and ramped-voltage current-voltage measurements
Journal:Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
2002
47
 
2004
106
 
2005
68
 
1994
94
 
2001
67
 
2006
85