Browsing by Author Tse, MS

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TitleAuthor(s)Issue DateViews
 
2004
93
 
2004
112
 
2003
77
 
2003
76
 
2003
86
 
2006
63
 
2006
78
 
2005
78
 
2001
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2001
63
 
Post-breakdown conduction instability of ultrathin SiO 2 films observed in ramped-current and ramped-voltage current-voltage measurements
Journal:Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
2002
62
 
2004
117
 
2005
107
 
1994
142
 
2001
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2006
102