Browsing by Author Tse, MS

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TitleAuthor(s)Issue DateViews
 
2004
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2003
81
 
2003
77
 
2003
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2006
65
 
2006
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2001
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Post-breakdown conduction instability of ultrathin SiO 2 films observed in ramped-current and ramped-voltage current-voltage measurements
Journal:Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
2002
64
 
2004
119
 
2005
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1994
143
 
2001
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2006
106