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Showing results 97 to 116 of 234 < previous next >

Title	Author(s)	Issue Date
H-vacancy complex VInH4 abundance and its influences in n-type LEC InP Journal:Journal of Crystal Growth	Fung, S Zhao, Y Sun, N Beling, CD Chen, X Bi, K Wu, X Zhang, J Sun, T	2000
Hydrogen peroxide treatment induced rectifying behavior of Aun-ZnO contact Journal:Applied Physics Letters	Gu, QL Ling, CC Chen, XD Cheng, CK Ng, AMC Beling, CD Fung, S Djurišić, AB Lu, LW Brauer, G Ong, HC	2007
Hyperfine splitting in positronium measured through quantum beats in the 3γ decay Journal:Physics Letters, Section A: General, Atomic and Solid State Physics	Fan, S Beling, CD Fung, S	1996
Identification of charge states of indium vacancies in InP Journal:Acta Physica Polonica A	LiMing, W Fung, S Beling, CD	1999
Identification of charge states of indium vacancies in InP using the positron-electron auto-correlation function Journal:Journal of Physics Condensed Matter	Liming, W Fung, S Beling, CD Fuchs, M Seitsonen, AP	1998
Identification of vacancy-like defects in high-rate grown a-Si before and after ligh soaking by vepas Proceeding/Conference:Materials Research Society Symposium Proceedings	Zou, X Chan, YC Webb, DP Lam, YW Lin, SH Chan, FYM Hu, YF Weng, X Beling, CD Fung, SHY	1999
Identities of the deep level defects E 1/E 2 in 6H silicon carbide Proceeding/Conference:Materials Science Forum	Ling, CC Chen, XD Gong, M Weng, HM Hang, DS Beling, CD Fung, S Lam, TW Lam, CH	2004
Indium Tin Oxide (ITO) thin films: Fabrication, properties, post-deposition treatments and applications Book:Trends in Semiconductor Research	Wang, R Djurisic, A Beling, CD Fung, SHY	2005
Inexpensive circuit for the measurement of capture cross section of deep level defects in semiconductors Journal:Review of Scientific Instruments	Reddy, CV Fung, S Beling, CD	1996
Influence of annealing on Fermi-level pinning and current transport at Au-Si and Au-GaAs Interfaces Journal:Journal of Applied Physics	Chen, TP Liu, YC Fung, S Beling, CD	1995
Influence of annealing temperature and environment on the properties of indium tin oxide thin films Journal:Journal of Physics D: Applied Physics	Wang, RX Beling, CD Fung, S Djurišić, AB Ling, CC Kwong, C Li, S	2005
Influence of Fe doping concentration on some properties of semi-insulating InP Journal:Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors	Zhao, Y Luo, Y Fung, S Beling, CD Lin, L	2002
Influence of gaseous annealing environment on the properties of indium-tin-oxide thin films Journal:Journal of Applied Physics	Wang, RX Beling, CD Fung, S Djurišic, AB Ling, CC Li, S	2005
Influence of indium-tin-oxide thin-film quality on reverse leakage current of indium-tin-oxide/n-GaN Schottky contacts Journal:Applied Physics Letters	Wang, RX Xu, SJ Djurišić, AB Beling, CD Cheung, CK Cheung, CH Fung, S Zhao, DG Yang, H Tao, XM	2006
Interface characterisation and internal electric field evaluation of a-Si:H pin solar cell by variable energy positron annhilation spectroscopy Proceeding/Conference:Materials Research Society Symposium Proceedings	Zou, X Chan, YC Webb, DP Lam, YW Chan, FYM Lin, SH Hu, YF Beling, CD Fung, SHY	1999
Interfacial Fermi level and surface band bending in Ni/semi-insulating GaAs contact Journal:Journal of Applied Physics	Chen, TP Liu, YC Fung, S Beling, CD	1995
Investigation into the use of POSITRONFIT in the recovery of lifetime parameters using Monte-Carlo simulated lifetime spectra Journal:Materials Science Forum	Cheung, SH Beling, CD Fung, S Mackeown, PK	1997
Investigation of Pulse Light Emission from an Air Bubble Trapped in Water: Sonoluminescence Proceeding/Conference:Proceedings of the International Conference on Quantum Optics and Laser Physics	Fan, S Beling, CD Fung, SHY	1997
Investigation of residual donor defects in undoped and Fe-doped LEC InP Journal:Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors	Zhao, Y Sun, N Fung, S Beling, CD Sun, T Lin, L	2002
Is the Ga vacancy related defect the residual acceptor of gallium antimonide? Proceeding/Conference:Proceedings of the 3rd International Workshop on Positron Studies of Semiconductor Defects	Ling, FCC Chen, X Weng, HM Hang, DS Lui, MKP Lam, CH Cheah, KW Li, KF Mui, WK Beling, CD Fung, SHY	2003

Showing results 97 to 116 of 234 < previous next >