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Conference Paper: Is the Ga vacancy related defect the residual acceptor of gallium antimonide?
Title | Is the Ga vacancy related defect the residual acceptor of gallium antimonide? |
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Authors | |
Issue Date | 2003 |
Publisher | Tohoku University. |
Citation | Proceedings of the 3rd International Workshop on Positron Studies of Semiconductor Defects, p. 146-152 How to Cite? |
Persistent Identifier | http://hdl.handle.net/10722/109801 |
DC Field | Value | Language |
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dc.contributor.author | Ling, FCC | en_HK |
dc.contributor.author | Chen, X | en_HK |
dc.contributor.author | Weng, HM | en_HK |
dc.contributor.author | Hang, DS | en_HK |
dc.contributor.author | Lui, MKP | en_HK |
dc.contributor.author | Lam, CH | en_HK |
dc.contributor.author | Cheah, KW | en_HK |
dc.contributor.author | Li, KF | en_HK |
dc.contributor.author | Mui, WK | en_HK |
dc.contributor.author | Beling, CD | en_HK |
dc.contributor.author | Fung, SHY | en_HK |
dc.date.accessioned | 2010-09-26T01:37:51Z | - |
dc.date.available | 2010-09-26T01:37:51Z | - |
dc.date.issued | 2003 | en_HK |
dc.identifier.citation | Proceedings of the 3rd International Workshop on Positron Studies of Semiconductor Defects, p. 146-152 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/109801 | - |
dc.language | eng | en_HK |
dc.publisher | Tohoku University. | en_HK |
dc.relation.ispartof | Proceedings of the 3rd International Workshop on Positron Studies of Semiconductor Defects | en_HK |
dc.title | Is the Ga vacancy related defect the residual acceptor of gallium antimonide? | en_HK |
dc.type | Conference_Paper | en_HK |
dc.identifier.email | Ling, FCC: ccling@hkucc.hku.hk | en_HK |
dc.identifier.email | Beling, CD: cdbeling@hkucc.hku.hk | en_HK |
dc.identifier.email | Fung, SHY: sfung@hkucc.hku.hk | en_HK |
dc.identifier.authority | Ling, FCC=rp00747 | en_HK |
dc.identifier.authority | Beling, CD=rp00660 | en_HK |
dc.identifier.authority | Fung, SHY=rp00695 | en_HK |
dc.identifier.hkuros | 80031 | en_HK |
dc.identifier.spage | 146 | en_HK |
dc.identifier.epage | 152 | en_HK |