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Article: Influence of Fe doping concentration on some properties of semi-insulating InP
Title | Influence of Fe doping concentration on some properties of semi-insulating InP |
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Authors | |
Keywords | Defects InP Semi-insulation |
Issue Date | 2002 |
Publisher | London Corn Circular. |
Citation | Pan Tao Ti Hsueh Pao/Chinese Journal Of Semiconductors, 2002, v. 23 n. 10, p. 1041-1045 How to Cite? |
Abstract | Properties of Fe-doped semi-insulating (SI) InP with different iron concentration are studied by using Hall effect, current-voltage (I-V), photoluminescence spectroscopy (PL) and photocurrent spectroscopy (PC) measurements. I-V characteristics of SI InP strongly depend on Fe doping concentration. Fe doping concentration also influences optical properties and defective formation in as-grown SI InP. Band-gap narrowing phenomenon and defects in Fe doped SI InP are studied using PL and PC. |
Persistent Identifier | http://hdl.handle.net/10722/80516 |
ISSN | |
References |
DC Field | Value | Language |
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dc.contributor.author | Zhao, Y | en_HK |
dc.contributor.author | Luo, Y | en_HK |
dc.contributor.author | Fung, S | en_HK |
dc.contributor.author | Beling, CD | en_HK |
dc.contributor.author | Lin, L | en_HK |
dc.date.accessioned | 2010-09-06T08:07:19Z | - |
dc.date.available | 2010-09-06T08:07:19Z | - |
dc.date.issued | 2002 | en_HK |
dc.identifier.citation | Pan Tao Ti Hsueh Pao/Chinese Journal Of Semiconductors, 2002, v. 23 n. 10, p. 1041-1045 | en_HK |
dc.identifier.issn | 0253-4177 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/80516 | - |
dc.description.abstract | Properties of Fe-doped semi-insulating (SI) InP with different iron concentration are studied by using Hall effect, current-voltage (I-V), photoluminescence spectroscopy (PL) and photocurrent spectroscopy (PC) measurements. I-V characteristics of SI InP strongly depend on Fe doping concentration. Fe doping concentration also influences optical properties and defective formation in as-grown SI InP. Band-gap narrowing phenomenon and defects in Fe doped SI InP are studied using PL and PC. | en_HK |
dc.language | eng | en_HK |
dc.publisher | London Corn Circular. | en_HK |
dc.relation.ispartof | Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors | en_HK |
dc.subject | Defects | en_HK |
dc.subject | InP | en_HK |
dc.subject | Semi-insulation | en_HK |
dc.title | Influence of Fe doping concentration on some properties of semi-insulating InP | en_HK |
dc.type | Article | en_HK |
dc.identifier.openurl | http://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0899-9988&volume=23&spage=1041&epage=1044&date=2002&atitle=Influence+of+Fe+doping+concentration+on+some+properties+of+semi-insulating+InP | en_HK |
dc.identifier.email | Fung, S: sfung@hku.hk | en_HK |
dc.identifier.email | Beling, CD: cdbeling@hkucc.hku.hk | en_HK |
dc.identifier.authority | Fung, S=rp00695 | en_HK |
dc.identifier.authority | Beling, CD=rp00660 | en_HK |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.scopus | eid_2-s2.0-0036814111 | en_HK |
dc.identifier.hkuros | 75690 | en_HK |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-0036814111&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.volume | 23 | en_HK |
dc.identifier.issue | 10 | en_HK |
dc.identifier.spage | 1041 | en_HK |
dc.identifier.epage | 1045 | en_HK |
dc.publisher.place | China | en_HK |
dc.identifier.scopusauthorid | Zhao, Y=7406633326 | en_HK |
dc.identifier.scopusauthorid | Luo, Y=7404333050 | en_HK |
dc.identifier.scopusauthorid | Fung, S=7201970040 | en_HK |
dc.identifier.scopusauthorid | Beling, CD=7005864180 | en_HK |
dc.identifier.scopusauthorid | Lin, L=7404131111 | en_HK |
dc.identifier.issnl | 0253-4177 | - |