Browsing by Author Cheng, YC

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TitleAuthor(s)Issue Date
 
2007
Interface properties of N2O-annealed NH3-treated 6H-SiC MOS capacitor
Proceeding/Conference:Proceedings of the IEEE Hong Kong Electron Devices Meeting
1999
 
2001
Interface properties of N2O-annealed SiO2/SiC system
Proceeding/Conference:Proceedings of the IEEE Hong Kong Electron Devices Meeting
2000
 
Interface properties of NO-annealed N2O-grown oxynitride
Journal:IEEE Transactions on Electron Devices
1999
 
1985
 
Mathematical Modeling for Evaluating Gustatory Stimulation of Parotid Gland by Proton Density MRI
Proceeding/Conference:The International Society for Magnetic Resonance in Medicine (ISMRM) Annual Meeting & Exhibition
2017
 
1998
Mechanism analysis of gate-induced drain leakage in off-state n-MOSFET
Proceeding/Conference:Proceedings of the IEEE Hong Kong Electron Devices Meeting
1997
 
Mechanisms of gate-induced drain leakage in n-MOSFET's
Journal:Microelectronics Reliability
1998
 
2011
 
1993
New observation and improvement in GIDL current of N-MOSFET's with various kinds of gate oxides under hot-carrier stress
Proceeding/Conference:IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE
1997
 
1996
 
2005
Non-disruptive MPC-based Frequency And Voltage Control In Microgrids
Proceeding/Conference:2021 IEEE Madrid PowerTech Conference
2021
 
1998
 
2005
 
NOVEL NUMERICAL MODEL FOR SOI DEVICES.
Journal:Electron device letters
1985
 
1998