Skip navigation
HKU Login
Guest Login
Home
Publications
Researchers
Staff
Research Postgraduates
Organizations
Grants
Datasets
Deposit Data
HKUL Research Data Management
Theses
Patents
Community Service
Browsing by Author Cheng, YC
Jump to:
0-9
A
B
C
D
E
F
G
H
I
J
K
L
M
N
O
P
Q
R
S
T
U
V
W
X
Y
Z
中
or enter first few letters:
Showing results 57 to 76 of 109
< previous
next >
Title
Author(s)
Issue Date
Integration of systemic biology, chemical profile fingerprint and functional imaging technology for understanding therapeutic principle of Chinese medicinal formula: a study on classical Post-Stroke Formula
Proceeding/Conference:
Meeting of the Consortium for Globalization of Chinese Medicine, CGCM 2007
Shen, J
Rong, J
Tong, Y
So, KF
Lau, ASY
Liu, KJ
Tam, PKH
Cheng, YC
2007
Interface properties of N2O-annealed NH3-treated 6H-SiC MOS capacitor
Proceeding/Conference:
Proceedings of the IEEE Hong Kong Electron Devices Meeting
Lai, PT
Xu, JP
Chan, CL
Cheng, YC
1999
Interface properties of N2O-annealed SiC metal oxide semiconductor devices
Journal:
Solid-State Electronics
Chakraborty, S
Lai, PT
Xu, JP
Chan, CL
Cheng, YC
2001
Interface properties of N2O-annealed SiO2/SiC system
Proceeding/Conference:
Proceedings of the IEEE Hong Kong Electron Devices Meeting
Chakraborty, Supratic
Lai, PT
Chan, CL
Cheng, YC
2000
Interface properties of NO-annealed N2O-grown oxynitride
Journal:
IEEE Transactions on Electron Devices
Lai, PT
Xu, JP
Cheng, YC
1999
Invariant imbedding in semiconductor device simulation
Journal:
Solid State Electronics
Lai, PT
Cheng, YC
1985
Mathematical Modeling for Evaluating Gustatory Stimulation of Parotid Gland by Proton Density MRI
Proceeding/Conference:
The International Society for Magnetic Resonance in Medicine (ISMRM) Annual Meeting & Exhibition
Cheng, YC
Liu, YJ
Lee, YH
Chang, HCC
Chiu, HC
Chiu, TW
Hsu, K
Hsu, HH
Juan, CJ
2017
Mechanism analysis of gate-induced drain leakage in off-state n-MOSFET
Journal:
Microelectronics Reliability
Huang, L
Lai, PT
Xu, JP
Cheng, YC
1998
Mechanism analysis of gate-induced drain leakage in off-state n-MOSFET
Proceeding/Conference:
Proceedings of the IEEE Hong Kong Electron Devices Meeting
Huang, L
Lai, PT
Xu, JP
Cheng, YC
1997
Mechanisms of gate-induced drain leakage in n-MOSFET's
Journal:
Microelectronics Reliability
Huang, L
Lai, PT
Xu, JP
Cheng, YC
1998
Molecular histology analysis by matrix-assisted laser desorption/ ionization imaging mass spectrometry using gold nanoparticles as matrix
Journal:
Rapid Communications in Mass Spectrometry
Tang, HW
Wong, MYM
Lam, W
Cheng, YC
Che, CM
Ng, KM
2011
A new method for extracting the trap energy in insulators
Journal:
Journal of Applied Physics
Fleischer, S
Lai, PT
Cheng, YC
1993
New observation and improvement in GIDL current of N-MOSFET's with various kinds of gate oxides under hot-carrier stress
Proceeding/Conference:
IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE
Lai, PT
Jingping, Xu
Zeng, X
Cheng, YC
1997
New observation and improvement in GIDL of n-MOSFETs with various kinds of N2O-based gate oxides under hot-carrier stress
Journal:
Solid-State Electronics
Lai, PT
Xu, J
Zeng, X
Cheng, YC
1996
New targets and inhibitors of HBV replication to combat drug resistance
Journal:
Journal of Clinical Virology
Cheng, YC
Ying, CX
Leung, CH
Li, Y
2005
Non-disruptive MPC-based Frequency And Voltage Control In Microgrids
Proceeding/Conference:
2021 IEEE Madrid PowerTech Conference
Cheng, YC
Liu, T
Hill, DJ
2021
A novel distributed system for plasma immersion ion implanter control and automation
Journal:
Review of Scientific Instruments
Liu, AG
Wang, XF
Tang, BY
Chu, PK
Ko, PK
Cheng, YC
1998
Novel mechanism of inhibition of nuclear factor-κB DNA-binding activity by diterpenoids isolated from Isodon rubescens
Journal:
Molecular Pharmacology
Leung, CH
Grill, SP
Lam, W
Han, QB
Sun, HD
Cheng, YC
2005
NOVEL NUMERICAL MODEL FOR SOI DEVICES.
Journal:
Electron device letters
Lai, PT
Cheng, YC
1985
Off-state gate current with quasi-zero temperature coefficient in n-MOSFETs with reoxidized nitrided oxide as gate dielectric
Journal:
Microelectronics Reliability
Lai, PT
Xu, JP
Lo, HB
Cheng, YC
1998