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Collection's Items (Sorted by Submit Date in Descending order): 381 to 400 of 3217
TitleAuthor(s)Issue Date
Coherent quantum dynamics of excitons in monolayer transition metal dichalcogenides
Proceeding/Conference:Proceedings of SPIE - The International Society for Optical Engineering
2016
Temperature and magnetic field dependent photoluminescence from carbon nanotubes
Proceeding/Conference:International Journal of Modern Physics B
2007
2020
High On-Current 2D nFET of 390 \mu A/\mu m at V_{DS = 1V using Monolayer CVD MoS2 without Intentional Doping
Proceeding/Conference:Digest of Technical Papers - Symposium on VLSI Technology
2020
2019
2019
Experimental observation of chiral phonons in monolayer WSe<inf>2</inf>
Proceeding/Conference:Proceedings of SPIE - The International Society for Optical Engineering
2019
High Performance WSe <inf>2</inf> Transistors with Multilayer Graphene Source/Drain
Proceeding/Conference:2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2018 - Proceedings
2018
Spectroscopic signature of chiral phonons in 2D materials
Proceeding/Conference:Conference on Lasers and Electro-Optics
2018
2018
2018
Monolayer MoS<inf>2</inf> for nonvolatile memory applications
Proceeding/Conference:2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2016 - Proceedings
2017
Photoluminescence enhancement in defect monolayer MoSe<inf>2</inf> by hydrohalic acid treatment
Proceeding/Conference:2016 Conference on Lasers and Electro-Optics, CLEO 2016
2016
2017
2016
2016
TDDB reliability improvement in Cu damascene by using a bilayer-structured PECVD SiC dielectric barrier
Proceeding/Conference:Proceedings of the IEEE 2002 International Interconnect Technology Conference, IITC 2002
2002
TMD FinFET with 4 nm thin body and back gate control for future low power technology
Proceeding/Conference:International Electron Devices Meeting (IEDM)
2015
Grain size effect of monolayer MoS2 transistors characterized by second harmonic generation mapping
Proceeding/Conference:Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA
2015
2015
Collection's Items (Sorted by Submit Date in Descending order): 381 to 400 of 3217