Browsing by Author Cheng, YC

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TitleAuthor(s)Issue DateViews
 
2007
72
 
1992
57
 
2000
126
 
2000
88
 
Improvement of channel-current-induced gate-oxide breakdown in n-MOSFET's using rapid thermal nitridation
Proceeding/Conference:Proceedings of the 3rd International Conference on Solid State and Integrated Circuit Technology
1992
24
 
1992
56
 
1999
63
 
2007
 
2007
69
 
2008
70
 
Instability in GIDL current of thermally-nitrided-oxide n-MOSFET's
Proceeding/Conference:International Conference on VLSI and CAD Proceedings
1991
30
 
1997
100
 
2007
57
Interface properties of N2O-annealed NH3-treated 6H-SiC MOS capacitor
Proceeding/Conference:Proceedings of the IEEE Hong Kong Electron Devices Meeting
1999
65
 
2001
Interface properties of N2O-annealed SiO2/SiC system
Proceeding/Conference:Proceedings of the IEEE Hong Kong Electron Devices Meeting
2000
57
 
Interface properties of NO-annealed N2O-grown oxynitride
Journal:IEEE Transactions on Electron Devices
1999
61
 
1985
44
 
Mathematical Modeling for Evaluating Gustatory Stimulation of Parotid Gland by Proton Density MRI
Proceeding/Conference:The International Society for Magnetic Resonance in Medicine (ISMRM) Annual Meeting & Exhibition
2017
12
Mechanism analysis of gate-induced drain leakage in off-state n-MOSFET
Proceeding/Conference:Proceedings of the IEEE Hong Kong Electron Devices Meeting
1997
79