Browsing by Author Cheng, YC

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TitleAuthor(s)Issue Date
 
Electrical properties of different NO-annealed oxynitrides
Proceeding/Conference:Journal of Non-Crystalline Solids
1999
 
Electron trapping and detrapping behaviors of thin thermally nitrided oxides
Proceeding/Conference:Techical Digest of 1989 International Conference on VLSI and CAD (ICVC '89)
1989
 
2000
 
Enhancement of 1/f noise degradation in n-MOSFETs under AC hot-carrier stress
Proceeding/Conference:Proceedings of 15th International Conference Noise in Physical Systems and 1/f Fluctuations
1999
 
2006
 
2005
 
Gate dielectrics prepared by double nitridation in NO and N2O
Journal:Applied Physics A: Materials Science and Processing
2000
 
2007
 
1999
 
1998
 
Histochemical Analysis of Medicinal Plants by Using Matrix-Assisted Laser Desorption / Ionization Mass Spectrometry
Proceeding/Conference:Meeting of Consortium for Globalization of Chinese Medicine, CGCM 2007
2007
 
1992
 
2000
 
2007
 
1992
 
2000
 
An, FPBai, WDBalantekin, ABBishai, MBlyth, SCao, GFCao, JChang, JFChang, YChen, HSChen, HYChen, SMChen, YChen, YXCheng, JCheng, JCheng, YCCheng, ZKCherwinka, JJChu, MCCummings, JPDalager, ODeng, FSDing, YYDiwan, MVDohnal, TDolzhikov, DDove, JDugas, KVDuyang, HYDwyer, DAGallo, JPGonchar, MGong, GHGong, HGu, WQGuo, JYGuo, LGuo, XHGuo, YHGuo, ZHackenburg, RWHan, YHans, SHe, MHeeger, KMHeng, YKHor, YKHsiung, YBHu, BZHu, JRHu, THu, ZJHuang, HXHuang, JHHuang, XTHuang, YBHuber, PJaffe, DEJen, KLJi, XLJi, XPJohnson, RAJones, DKang, LKettell, SHKohn, SKramer, MLangford, TJLee, JLee, JHCLei, RTLeitner, RLeung, JKCLi, FLi, HLLi, JJLi, QJLi, RHLi, SLi, SCLi, WDLi, XNLi, XQLi, YFLi, ZBLiang, HLin, CJLin, GLLin, SLing, JJLink, JMLittenberg, LLittlejohn, BRLiu, JCLiu, JLLiu, JXLu, CLu, HQLuk, KBMa, BZMa, XBMa, XYMa, YQMandujano, RCMarshall, CMcDonald, KTMcKeown, RDMeng, YNapolitano, JNaumov, DNaumova, ENguyen, TMTOchoa-Ricoux, JPOlshevskiy, APark, JPatton, SPeng, JCPun, CSJQi, FZQi, MQian, XRaper, NRen, JReveco, CMRosero, RRoskovec, BRuan, XCRussell, BSteiner, HSun, JLTmej, TTreskov, KTse, WHTull, CETung, YCViren, BVorobel, VWang, CHWang, JWang, MWang, NYWang, RGWang, WWang, XWang, YWang, YFWang, ZWang, ZWang, ZMWei, HYWei, LHWen, LJWhisnant, KWhite, CGWong, HLHWorcester, EWu, DRWu, QWu, WJXia, DMXie, ZQXing, ZZXu, HKXu, JLXu, TXue, TYang, CGYang, LYang, YZYao, HFYe, MYeh, MYoung, BLYu, HZYu, ZYYue, BBZavadskyi, VZeng, SZeng, YZhan, LZhang, CZhang, FYZhang, HHZhang, JLZhang, JWZhang, QMZhang, SQZhang, XTZhang, YMZhang, YXZhang, YYZhang, ZJZhang, ZPZhang, ZYZhao, JZhao, RZZhou, LZhuang, HLZou, JH
22-May-2023
 
2000
 
Improvement of channel-current-induced gate-oxide breakdown in n-MOSFET's using rapid thermal nitridation
Proceeding/Conference:Proceedings of the 3rd International Conference on Solid State and Integrated Circuit Technology
1992
 
1992