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Title	Author(s)	Issue Date
Electrical properties of different NO-annealed oxynitrides Proceeding/Conference:Journal of Non-Crystalline Solids	Xu, JP Lai, PT Cheng, YC	1999
Electron trapping and detrapping behaviors of thin thermally nitrided oxides Proceeding/Conference:Techical Digest of 1989 International Conference on VLSI and CAD (ICVC '89)	Lai, PT Wong, H Cheng, YC Lo, HB Liu, ZH	1989
Energy levels of interface states generated in n-MOSFETs by hot-carrier stresses Journal:Solid-State Electronics	Xu, JP Lai, PT Cheng, YC	2000
Enhancement of 1/f noise degradation in n-MOSFETs under AC hot-carrier stress Proceeding/Conference:Proceedings of 15th International Conference Noise in Physical Systems and 1/f Fluctuations	Lai, PT Xu, J Cheng, YC	1999
Eriocalyxin B inhibits nuclear factor-κB activation by interfering with the binding of both p65 and p50 to the response element in a noncompetitive manner Journal:Molecular Pharmacology	Leung, CH Grill, SP Lam, W Gao, W Sun, HD Cheng, YC	2006
Expression of deoxynucleotide carrier is not associated with the mitochondrial DNA depletion caused by anti-HIV dideoxynucleoside analogs and mitochondrial dNTP uptake Journal:Molecular Pharmacology	Lam, W Chen, C Ruan, S Leung, CH Cheng, YC	2005
Gate dielectrics prepared by double nitridation in NO and N2O Journal:Applied Physics A: Materials Science and Processing	Xu, JP Lai, PT Cheng, YC	2000
Genome-wide biological response fingerprinting (BioReF) of the Chinese botanical formulation ISF-1 enables the selection of multiple marker genes as a potential metric for quality control Journal:Journal of Ethnopharmacology	Rong, J Tilton, R Shen, J Ng, KM Liu, C Tam, PKH Lau, ASY Cheng, YC	2007
Greatly suppressed stress-induced shift of gate-induced drain leakage in N20-based n-MOSFET's Journal:Solid-State Electronics	Xu, J Lai, PT Huang, L Lo, SHB Cheng, YC	1999
Greatly suppressed stress-induced shift of GIDL in N 2O-based n-MOSFET's Journal:Solid-State Electronics	Xu, JP Lai, PT Huang, L Lo, HB Cheng, YC	1998
Histochemical Analysis of Medicinal Plants by Using Matrix-Assisted Laser Desorption / Ionization Mass Spectrometry Proceeding/Conference:Meeting of Consortium for Globalization of Chinese Medicine, CGCM 2007	Tang, HW Ng, KM Liang, ZT Che, CM Cheng, YC Zhao, ZZ	2007
Hot-carrier-induced degradation in reoxidized-nitrided-oxide n-MOSFET's under mixed AC-DC stressing Journal:Electron device letters	Ma, ZJ Lai, PT Cheng, YC	1992
A humidity-sensing model for metal-insulator-semiconductor capacitors with porous ceramic film Journal:Journal of Applied Physics	Li, GQ Lai, PT Huang, MQ Zeng, SH Li, B Cheng, YC	2000
The impact of hypoxic treatment on the expression of phosphoglycerate kinase and the cytotoxicity of troxacitabine and gemcitabine Journal:Molecular Pharmacology	Lam, W Leung, CH Bussom, S Cheng, YC	2007
Impact of nitridation/reoxidation on performance degradation in n-MOSFETs under Fowler-Nordheim injection Journal:Solid-State Electronics	Ma, ZJ Liu, ZH Lai, PT Fleischer, S Cheng, YC	1992
Improved interface properties of p-type 6H–SiC/SiO2 system by NH3 pretreatment Journal:Applied Physics Letters	Xu, JP Lai, PT Chan, CL Cheng, YC	2000
Improved Measurement of the Evolution of the Reactor Antineutrino Flux and Spectrum at Daya Bay Journal:Physical Review Letters	An, FP Bai, WD Balantekin, AB Bishai, M Blyth, S Cao, GF Cao, J Chang, JF Chang, Y Chen, HS Chen, HY Chen, SM Chen, Y Chen, YX Cheng, J Cheng, J Cheng, YC Cheng, ZK Cherwinka, JJ Chu, MC Cummings, JP Dalager, O Deng, FS Ding, YY Diwan, MV Dohnal, T Dolzhikov, D Dove, J Dugas, KV Duyang, HY Dwyer, DA Gallo, JP Gonchar, M Gong, GH Gong, H Gu, WQ Guo, JY Guo, L Guo, XH Guo, YH Guo, Z Hackenburg, RW Han, Y Hans, S He, M Heeger, KM Heng, YK Hor, YK Hsiung, YB Hu, BZ Hu, JR Hu, T Hu, ZJ Huang, HX Huang, JH Huang, XT Huang, YB Huber, P Jaffe, DE Jen, KL Ji, XL Ji, XP Johnson, RA Jones, D Kang, L Kettell, SH Kohn, S Kramer, M Langford, TJ Lee, J Lee, JHC Lei, RT Leitner, R Leung, JKC Li, F Li, HL Li, JJ Li, QJ Li, RH Li, S Li, SC Li, WD Li, XN Li, XQ Li, YF Li, ZB Liang, H Lin, CJ Lin, GL Lin, S Ling, JJ Link, JM Littenberg, L Littlejohn, BR Liu, JC Liu, JL Liu, JX Lu, C Lu, HQ Luk, KB Ma, BZ Ma, XB Ma, XY Ma, YQ Mandujano, RC Marshall, C McDonald, KT McKeown, RD Meng, Y Napolitano, J Naumov, D Naumova, E Nguyen, TMT Ochoa-Ricoux, JP Olshevskiy, A Park, J Patton, S Peng, JC Pun, CSJ Qi, FZ Qi, M Qian, X Raper, N Ren, J Reveco, CM Rosero, R Roskovec, B Ruan, XC Russell, B Steiner, H Sun, JL Tmej, T Treskov, K Tse, WH Tull, CE Tung, YC Viren, B Vorobel, V Wang, CH Wang, J Wang, M Wang, NY Wang, RG Wang, W Wang, X Wang, Y Wang, YF Wang, Z Wang, Z Wang, ZM Wei, HY Wei, LH Wen, LJ Whisnant, K White, CG Wong, HLH Worcester, E Wu, DR Wu, Q Wu, WJ Xia, DM Xie, ZQ Xing, ZZ Xu, HK Xu, JL Xu, T Xue, T Yang, CG Yang, L Yang, YZ Yao, HF Ye, M Yeh, M Young, BL Yu, HZ Yu, ZY Yue, BB Zavadskyi, V Zeng, S Zeng, Y Zhan, L Zhang, C Zhang, FY Zhang, HH Zhang, JL Zhang, JW Zhang, QM Zhang, SQ Zhang, XT Zhang, YM Zhang, YX Zhang, YY Zhang, ZJ Zhang, ZP Zhang, ZY Zhao, J Zhao, RZ Zhou, L Zhuang, HL Zou, JH	22-May-2023
Improved performance and reliability of N 2O-grown oxynitride on 6H-SiC Journal:IEEE Electron Device Letters	Xu, JP Lai, PT Chan, CL Li, B Cheng, YC	2000
Improvement of channel-current-induced gate-oxide breakdown in n-MOSFET's using rapid thermal nitridation Proceeding/Conference:Proceedings of the 3rd International Conference on Solid State and Integrated Circuit Technology	Huang, MQ Lai, PT Ma, ZJ Cheng, YC Liu, BY	1992
Improvement of punchthrough-induced gate-oxide breakdown in n-channel metal-oxide-semiconductor field-effect transistors using rapid thermal nitridation Journal:Applied Physics Letters	Huang, MQ Lai, PT Ma, ZJ Wong, H Cheng, YC	1992

Showing results 31 to 50 of 109 < previous next >