Browsing by Author Reddy, CV

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TitleAuthor(s)Issue DateViews
 
Characterization of optical and structural properties of Pt-Si interface by spectroscopic ellipsometry
Proceeding/Conference:Proceedings of the 22nd International Conference on the Physics of Semiconductors, Canada
1994
52
 
1998
106
 
DX-like properties of the EL6 defect family in GaAs
Journal:Physical Review B (Condensed Matter)
1998
64
 
1996
66
 
1996
62
 
1997
83
 
Rapid thermal annealing induced deep level defects in Te-doped GaAs
Journal:Physica Status Solidi (A) Applied Research
1998
76
 
1996
63
 
The slow-positron beam facility at the University of Hong Kong
Proceeding/Conference:AIP Conference Proceedings 303 Slow Positron Beam Techniques for Solid and Surfaces: Fifth International Workshop
1994
94
 
The transformations of the EL6 deep level defect in n-GaAs: is EL6 a DX-like center?
Proceeding/Conference:Materials Research Society Symposium Proceedings
1998
58