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Article: A simple and inexpensive circuit for emission and capture deep level transient spectroscopy

TitleA simple and inexpensive circuit for emission and capture deep level transient spectroscopy
Authors
KeywordsInstruments
Issue Date1996
PublisherAmerican Institute of Physics. The Journal's web site is located at http://ojps.aip.org/rsio/
Citation
Review Of Scientific Instruments, 1996, v. 67 n. 1, p. 257-261 How to Cite?
AbstractA simple and inexpensive circuit for deep level transient spectroscopy is described, which allows rapid characterization of emission as well as capture activation energies of deep levels. This flexibility of making capture activation studies affords more information on defect morphology than the more standard emission activation studies. This is demonstrated by making a representative capture activation energy measurement on the EL6 level in undoped n-type GaAs of 0.484±0.005 eV. Also the spectrometer has shown better performance than earlier reported systems by its ability to resolve the side peaks of the EL6 level, for which emission activation energies of 0.29 and 0.4 eV are assigned. Constructed around a commercially available capacitance meter and pulse generator, the control circuitry is designed and developed using inexpensive and off-the-shelf integrated circuits. © 1996 American Institute of Physics.
Persistent Identifierhttp://hdl.handle.net/10722/42229
ISSN
2015 Impact Factor: 1.336
2015 SCImago Journal Rankings: 0.571
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorReddy, CVen_HK
dc.contributor.authorFung, Sen_HK
dc.contributor.authorBeling, CDen_HK
dc.date.accessioned2007-01-08T02:32:03Z-
dc.date.available2007-01-08T02:32:03Z-
dc.date.issued1996en_HK
dc.identifier.citationReview Of Scientific Instruments, 1996, v. 67 n. 1, p. 257-261en_HK
dc.identifier.issn0034-6748en_HK
dc.identifier.urihttp://hdl.handle.net/10722/42229-
dc.description.abstractA simple and inexpensive circuit for deep level transient spectroscopy is described, which allows rapid characterization of emission as well as capture activation energies of deep levels. This flexibility of making capture activation studies affords more information on defect morphology than the more standard emission activation studies. This is demonstrated by making a representative capture activation energy measurement on the EL6 level in undoped n-type GaAs of 0.484±0.005 eV. Also the spectrometer has shown better performance than earlier reported systems by its ability to resolve the side peaks of the EL6 level, for which emission activation energies of 0.29 and 0.4 eV are assigned. Constructed around a commercially available capacitance meter and pulse generator, the control circuitry is designed and developed using inexpensive and off-the-shelf integrated circuits. © 1996 American Institute of Physics.en_HK
dc.format.extent90174 bytes-
dc.format.extent9781 bytes-
dc.format.mimetypeapplication/pdf-
dc.format.mimetypetext/plain-
dc.languageengen_HK
dc.publisherAmerican Institute of Physics. The Journal's web site is located at http://ojps.aip.org/rsio/en_HK
dc.relation.ispartofReview of Scientific Instrumentsen_HK
dc.rightsReview of Scientific Instruments. Copyright © American Institute of Physics.en_HK
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License-
dc.subjectInstrumentsen_HK
dc.titleA simple and inexpensive circuit for emission and capture deep level transient spectroscopyen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0034-6748&volume=67&issue=1&spage=257&epage=261&date=1996&atitle=A+simple+and+inexpensive+circuit+for+emission+and+capture+deep+level+transient+spectroscopyen_HK
dc.identifier.emailFung, S: sfung@hku.hken_HK
dc.identifier.emailBeling, CD: cdbeling@hkucc.hku.hken_HK
dc.identifier.authorityFung, S=rp00695en_HK
dc.identifier.authorityBeling, CD=rp00660en_HK
dc.description.naturepublished_or_final_versionen_HK
dc.identifier.doi10.1063/1.1147586en_HK
dc.identifier.scopuseid_2-s2.0-0012624095en_HK
dc.identifier.hkuros9450-
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-0012624095&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume67en_HK
dc.identifier.issue1en_HK
dc.identifier.spage257en_HK
dc.identifier.epage261en_HK
dc.identifier.isiWOS:A1996TQ62300038-
dc.publisher.placeUnited Statesen_HK
dc.identifier.scopusauthoridReddy, CV=8621657000en_HK
dc.identifier.scopusauthoridFung, S=7201970040en_HK
dc.identifier.scopusauthoridBeling, CD=7005864180en_HK

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