Skip navigation
HKU Login
Guest Login
Home
Publications
Researchers
Staff
Research Postgraduates
Organizations
Grants
Datasets
Deposit Data
HKUL Research Data Management
Theses
Patents
Community Service
Browsing by Author Zeng, SH
Jump to:
0-9
A
B
C
D
E
F
G
H
I
J
K
L
M
N
O
P
Q
R
S
T
U
V
W
X
Y
Z
中
or enter first few letters:
Showing results 7 to 14 of 14
< previous
Title
Author(s)
Issue Date
A new multi-function thin-film microsensor based on Ba1-xLaxTiO3
Journal:
Smart Materials and Structures
Li, B
Lai, PT
Li, GQ
Zeng, SH
Huang, MQ
2000
New thin-film humidity and thermal micro-sensor with Al/SrNbxTi1-xO3/SiO2/Si structure
Journal:
Sensors and Actuators, A: Physical
Li, GQ
Lai, PT
Zeng, SH
Huang, MQ
Li, B
1999
Photo-, thermal and humidity sensitivity characteristics of sr1-xLaxTiO3 film on SiO2/Si substrate
Journal:
Sensors and Actuators, A: Physical
Li, GQ
Lai, PT
Zeng, SH
Huang, MQ
Cheng, YC
1997
Photoelectrical properties of Ba1-xLaxTiO3 thin-film resistor
Journal:
Sensors and Actuators, A: Physical
Li, B
Lai, PT
Li, GQ
Zeng, SH
Huang, MQ
2000
Sensing properties of Ba1-xLaxNbyTi1-yO3 (x=0.25%, y=0.25%) thin-film on SiO2/Si substrate
Journal:
Materials Research Society Symposium - Proceedings
Li, B
Lai, PT
Li, GQ
Zeng, SH
Huang, MQ
2001
A study of various oxide/silicon interfaces by Ar + backsurface bombardment
Journal:
Journal of Applied Physics
Lai, PT
Li, GQ
Huang, MQ
Zeng, SH
Cheng, YC
1999
Suppression of hot-electron-induced interface degradation in metal-oxide-semiconductor devices by backsurface argon bombardment
Journal:
Microelectronics Reliability
Huang, MQ
Lai, PT
Xu, JP
Zeng, SH
Li, GQ
Cheng, YC
1998
Suppression of hot-electron-induced interface degradation in metal-oxide-semiconductor devices by backsurface argon bombardment
Proceeding/Conference:
Proceedings of the IEEE Hong Kong Electron Devices Meeting
Huang, MQ
Lai, PT
Xu, JP
Zeng, SH
Li, GQ
Cheng, YC
1997