Browsing by Author Ji, F

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TitleAuthor(s)Issue DateViews
 
Impacts of Ti content and annealing temperature on electrical properties of Si MOS capacitors with HfTiON gate dielectric
Proceeding/Conference:2009 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2009
2009
195
 
2012
46
 
2007
48
 
2011
71
 
2011
85
 
2012
47
 
Improved Memory Window of MONOS Memory Capacitor with GdON as Charge Storage Layer
Proceeding/Conference:I E E E Conference on Electron Devices and Solid-State Circuits Proceedings
2012
60
Influence of gate-electrode fringing capacitance on threshold voltage of nano-MOSFET
Proceeding/Conference:ICSICT-2006: 2006 8th International Conference on Solid-State and Integrated Circuit Technology, Proceedings
2007
78
 
Influence of natridation annealing of HfTiO on electrical properties of MOS device
Journal:Guti Dianzixue Yanjiu Yu Jinzhan/Research and Progress of Solid State Electronics
2008
68
 
2008
82
 
A novel MONOS memory with high-κ HfLaON as charge-storage layer
Journal:IEEE Transactions on Device and Materials Reliability
2011
85
 
2014
42
 
2007
78
 
2012
36