Browsing by Author Fung, KSM

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TitleAuthor(s)Issue Date
 
A novel design of grating projection system for 3D reconstruction of wafer bumps
Proceeding/Conference:Proceedings of SPIE - The International Society for Optical Engineering
Shu, YChung, RTan, ZCheng, JLam, EYFung, KSMWang, F
2006
 
A polynomial phase-shift algorithm for high precision three-dimensional profilometry
Proceeding/Conference:Proceedings of SPIE - The International Society for Optical Engineering
Deng, FLiu, CSze, WDeng, JFung, KSMLam, EY
2013
 
Projection optics design for tilted projection of fringe patterns
Journal:Optical Engineering
Shu, YChung, RTan, ZCheng, JLam, EYFung, KSMWang, F
2008
 
Reference-free detection of semiconductor assembly defect
Proceeding/Conference:Proceedings of SPIE - The International Society for Optical Engineering
Ng, ANYLam, EYChung, RFung, KSMLeung, WH
2005
 
Regularized multiframe phase-shifting algorithm for three-dimensional profilometry
Journal:Applied Optics
Deng, FSze, WFDeng, JFung, KSMLeung, WHLam, EY
2012
 
Structured-light based sensing using a single fixed fringe grating: Fringe boundary detection and 3-D reconstruction
Journal:IEEE Transactions on Electronics Packaging Manufacturing
Cheng, JChung, CKRLam, EYFung, KSMWang, FLeung, WH
2008
 
A three-dimensional imaging system for surface profilometry of moving objects
Proceeding/Conference:IEEE International Workshop on Imaging Systems and Techniques Proceedings
Deng, FLiu, JDeng, JFung, KSMLam, EY
2013
 
Three-dimensional reconstruction of wafer solder bumps using binary pattern projection
Proceeding/Conference:Proceedings of SPIE - The International Society for Optical Engineering
Cheng, JChung, RLam, EYFung, KSMWang, FLeung, WH
2005
Showing results 14 to 21 of 21 < previous