Browsing by Author Gong, M

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TitleAuthor(s)Issue DateViews
 
2005
153
 
2004
161
 
Deep level defects in 6H silicon carbide induced by particles irradiations
Proceeding/Conference:The National Conference of Semiconductor Physics
2005
128
 
2006
127
 
2003
227
 
2000
157
 
1999
208
 
Deep level transient spectroscopy study of particle irradiation induced defects in n-6H-SiC
Proceeding/Conference:Bulletin of the American Physical Society
2004
116
 
1998
201
 
1998
94
 
2006
216
 
2004
196
 
1999
208
 
2006
141
 
Film thickness degradation of Au/GaN Schottky contact characteristics
Journal:Materials Science and Engineering B: Solid-State Materials for Advanced Technology
2005
233
 
1998
129
 
1999
158
 
2002
170
Identities of the deep level defects E 1/E 2 in 6H silicon carbide
Proceeding/Conference:Materials Science Forum
2004
75
 
2009
176