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Browsing by Author Adamu-Lema, Fikru
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Showing results 1 to 7 of 7
Title
Author(s)
Issue Date
3-D statistical simulation comparison of oxide reliability of planar MOSFETs and FinFET
Journal:
IEEE Transactions on Electron Devices
Gerrer, Louis
Amoroso, Salvatore Maria
Markov, Stanislav
Adamu-Lema, Fikru
Asenov, Asen
2013
3D dynamic RTN simulation of a 25nm MOSFET: The importance of variability in reliability evaluation of decananometer devices
Proceeding/Conference:
2012 15th International Workshop on Computational Electronics, IWCE 2012
Amoroso, Salvatore Maria
Adamu-Lema, Fikru
Markov, Stanislav
Gerrer, Louis
Asenov, Asen
2012
Accuracy and issues of the spectroscopic analysis of RTN traps in nanoscale MOSFETs
Journal:
IEEE Transactions on Electron Devices
Adamu-Lema, Fikru
Compagnoni, Christian Monzio
Amoroso, Salvatore M.
Castellani, Niccolò
Gerrer, Louis
Markov, Stanislav
Spinelli, Alessandro S.
Lacaita, Andrea L.
Asenov, Asen
2013
Comprehensive statistical comparison of RTN and BTI in deeply scaled MOSFETs by means of 3D atomistic simulation
Proceeding/Conference:
European Solid-State Device Research Conference
Amoroso, Salvatore M.
Gerrer, Louis
Markov, Stanislav
Adamu-Lema, Fikru
Asenov, Asen
2012
Impact of statistical variability and 3D electrostatics on post-cycling anomalous charge loss in nanoscale Flash memories
Proceeding/Conference:
IEEE International Reliability Physics Symposium Proceedings
Amoroso, Salvatore Maria
Gerrer, Louis
Adamu-Lema, Fikru
Markov, Stanislav
Asenov, Asen
2013
RTN and BTI in nanoscale MOSFETs: A comprehensive statistical simulation study
Journal:
Solid-State Electronics
Amoroso, Salvatore Maria
Gerrer, Louis
Markov, Stanislav
Adamu-Lema, Fikru
Asenov, Asen
2013
Statistical interactions of multiple oxide traps under BTI stress of nanoscale MOSFETs
Journal:
IEEE Electron Device Letters
Markov, Stanislav
Amoroso, Salvatore Maria
Gerrer, Louis
Adamu-Lema, Fikru
Asenov, Asen
2013