Results 21 to 32 of 32
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TypeTitleAuthor(s)YearViews
Nuclear penetration of surface functionalized gold nanoparticles
Journal:
Toxicology and Applied Pharmacology
Publisher:
Academic Press. The Journal's web site is located at http://www.elsevier.com/locate/taap
Gu, YJ; Cheng, J; Lin, CC; Lam, YW; Cheng, SH; Wong, WT2009722
 
Promoter hypermethylation mediates downregulation of thiamine receptor SLC19A3 in gastric cancer
Journal:
Tumor Biology
Publisher:
S Karger AG. The Journal's web site is located at http://www.karger.com/TBI
Liu, X; Lam, EKY; Wang, X; Zhang, J; Cheng, YY; Lam, YW; Ng, EKO; Yu, J; Chan, FKL; Jin, H; Sung, JJY2009205
 
A bioaccumulative cyclometalated platinum(II) complex with two-photon-induced emission for live cell imaging
Journal:
Inorganic Chemistry
Publisher:
American Chemical Society. The Journal's web site is located at http://pubs.acs.org/ic
Koo, CK; Wong, KL; Man, CWY; Lam, YW; So, LKY; Tam, HL; Tsao, SW; Cheah, KW; Lau, KC; Yang, YY; Chen, JC; Lam, MHW2009169
 
Photoinduced Dehydrogenation of Defects in Undoped a-Si:H Using Positron Annihilation Spectroscopy
Journal:
Physical Review Letters
Publisher:
American Physical Society. The Journal's web site is located at http://prl.aps.org
Zou, X; Chan, YC; Webb, DP; Lam, YW; Hu, YF; Beling, CD; Fung, S; Weng, HM2000474
 
Interface characterization and internal electric field evaluation of a-Si:H pin solar cell by variable energy positron annihilation spectroscopy
Proceedings/Conference:
Materials Research Society Symposium - Proceedings
Publisher:
Materials Research Society. The Journal's web site is located at http://www.mrs.org/publications/epubs/proceedings/spring2004/index.html
Zou, X; Chan, YC; Webb, DP; Lam, YW; Chan, FYM; Lin, SH; Hu, YF; Beling, CD; Fung, S1999103
 
Identification of vacancy-like defects in high-rate grown a-Si before and after light soaking by VEPAS
Proceedings/Conference:
Materials Research Society Symposium - Proceedings
Publisher:
Materials Research Society. The Journal's web site is located at http://www.mrs.org/publications/epubs/proceedings/spring2004/index.html
Zou, X; Chan, YC; Webb, DP; Lam, YW; Lin, SH; Chan, FYM; Hu, YF; Weng, X; Beling, CD; Fung, S1999104
 
Interface characterisation and internal electric field evaluation of a-Si:H pin solar cell by variable energy positron annhilation spectroscopy
Publisher:
Materials Research Society. The Journal's web site is located at http://www.mrs.org/publications/epubs/proceedings/spring2004/index.html
Zou, X; Chan, YC; Webb, DP; Lam, YW; Chan, FYM; Lin, SH; Hu, YF; Beling, CD; Fung, SHY1999468
 
Identification of vacancy-like defects in high-rate grown a-Si before and after ligh soaking by vepas
Publisher:
Materials Research Society. The Journal's web site is located at http://www.mrs.org/publications/epubs/proceedings/spring2004/index.html
Zou, X; Chan, YC; Webb, DP; Lam, YW; Lin, SH; Chan, FYM; Hu, YF; Weng, X; Beling, CD; Fung, SHY1999448
 
Depth profiling of vacancy-type defects in homogenous and multilayered a-Si films by positron beam Doppler broadening
Journal:
Journal of Non-Crystalline Solids
Publisher:
Elsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/jnoncrysol
Zou, X; Webb, DP; Chan, YC; Lam, YW; Hu, YF; Gong, M; Beling, CD; Fung, S1998110
 
Probing of microvoids in high-rate deposited α-Si : H thin films by variable energy positron annihilation spectroscopy
Journal:
Journal of Materials Research
Publisher:
Materials Research Society. The Journal's web site is located at http://www.mrs.org/publications/jmr
Zou, X; Webb, DP; Chan, YC; Lam, YW; Hu, YF; Fung, S; Beling, CD199898
 
Study of microvoids in high-rate a-Si:H using positron annihilation
Publisher:
Materials Research Society. The Journal's web site is located at http://www.mrs.org/publications/epubs/proceedings/spring2004/index.html
Zou, X; Webb, DP; Lin, SH; Lam, YW; Chan, YC; Hu, YF; Beling, CD; Fung, SHY1997386
 
Cell type- and differentiation stage-dependent expression of PML domains in rat, detected by monoclonal antibody HIS55
Journal:
Experimental Cell Research
Publisher:
Academic Press. The Journal's web site is located at http://www.elsevier.com/locate/yexcr
Lam, YW; Ammerlaan, W; O, WS; Kroese, F; Opstelten, D1995140
 
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