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Browsing by Author Reddy, CV
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Showing results 4 to 10 of 10
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Title
Author(s)
Issue Date
Inexpensive circuit for the measurement of capture cross section of deep level defects in semiconductors
Journal:
Review of Scientific Instruments
Reddy, CV
Fung, S
Beling, CD
1996
Nature of the bulk defects in GaAs through high-temperature quenching studies
Journal:
Physical Review B (Condensed Matter)
Reddy, CV
Fung, S
Beling, CD
1996
Positron deep level transient spectroscopy - A new application of positron annihilation to semiconductor physics
Journal:
Applied Surface Science
Beling, CD
Fung, S
Au, HL
Ling, CC
Reddy, CV
Deng, AH
Panda, BK
1997
Rapid thermal annealing induced deep level defects in Te-doped GaAs
Journal:
Physica Status Solidi (A) Applied Research
Reddy, CV
Fung, S
Beling, CD
1998
A simple and inexpensive circuit for emission and capture deep level transient spectroscopy
Journal:
Review of Scientific Instruments
Reddy, CV
Fung, S
Beling, CD
1996
The slow-positron beam facility at the University of Hong Kong
Proceeding/Conference:
AIP Conference Proceedings 303 Slow Positron Beam Techniques for Solid and Surfaces: Fifth International Workshop
Beling, CD
Fung, S
Weng, HM
Reddy, CV
Fan, SW
Shan, YY
Ling, CC
1994
The transformations of the EL6 deep level defect in n-GaAs: is EL6 a DX-like center?
Proceeding/Conference:
Materials Research Society Symposium Proceedings
Reddy, CV
Fung, SHY
Beling, CD
1998