Browsing by Author LIN, L

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TitleAuthor(s)Issue Date
 
2017
 
2017
 
Developing EAP expertise: Insights from teachers on professional growth
Proceeding/Conference:HKCPD Hub International Conference 2021 for English teaching professionals worldwide: Innovative Teaching and Research in English Language Education
2021
 
11-Mar-2024
 
2018
 
2018
 
2021
 
2009
 
2005
Effects of NO annealing on the characteristics of GaN MIS capacitor
Proceeding/Conference:2006 25th International Conference on Microelectronics, MIEL 2006 - Proceedings
2006
 
Effects of oxidation temperature on Ga 2O3 film thermally grown on GaN
Proceeding/Conference:Proceedings of IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC 2005
2005
 
Electrical transport properties of annealed undoped InP
Journal:Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors
2002
 
Aarts, AAAnderson, JEAnderson, CJAttridge, PRAttwood, AAxt, JBabel, MBahník, ŠBaranski, EBarnett-Cowan, MBartmess, EBeer, JBell, RBentley, HBeyan, LBinion, GBorsboom, DBosch, ABosco, FABowman, SDBrandt, MJBraswell, EBrohmer, HBrown, BTBrown, KBrüning, JCalhoun-Sauls, ACallahan, SPChagnon, EChandler, JChartier, CRCheung, FChristopherson, CDCillessen, LClay, RCleary, HCloud, MDConn, MCohoon, JColumbus, SCordes, ACostantini, GAlvarez, LDCCremata, ECrusius, JDeCoster, JDeGaetano, MAPenna, NDDen Bezemer, BDeserno, MKDevitt, ODewitte, LDobolyi, DGDodson, GTDonnellan, MBDonohue, RDore, RADorrough, ADreber, ADugas, MDunn, EWEasey, KEboigbe, SEggleston, CEmbley, JEpskamp, SErrington, TMEstel, VFarach, FJFeather, JFedor, AFernández-Castilla, BFiedler, SField, JGFitneva, SAFlagan, TForest, ALForsell, EFoster, JDFrank, MCFrazier, RSFuchs, HGable, PGalak, JGalliani, EMGampa, AGarcia, SGazarian, DGilbert, EGiner-Sorolla, RGlöckner, AGoellner, LGoh, JXGoldberg, RGoodbourn, PTGordon-McKeon, SGorges, BGorges, JGoss, JGraham, JGrange, JAGray, JHartgerink, CHartshorne, JHasselman, FHayes, THeikensten, EHenninger, FHodsoll, JHolubar, THoogendoorn, GHumphries, DJHung, COYImmelman, NIrsik, VCJahn, GJäkel, FJekel, MJohannesson, MJohnson, LGJohnson, DJJohnson, KMJohnston, WJJonas, KJoy-Gaba, JAKappes, HBKelso, KKidwell, MCKim, SKKirkhart, MKleinberg, BKnežević, GKolorz, FMKossakowski, JJKrause, RWKrijnen, JKuhlmann, TKunkels, YKKyc, MMLai, CKLaique, ALakens, DLane, KALassetter, BLazarević, LBLe Bel, EPLee, KJLee, MLemm, KLevitan, CALewis, MLin, LLin, SLippold, MLoureiro, DLuteijn, IMacKinnon, SMainard, HNMarigold, DCMartin, DPMartinez, TMasicampo, EJMatacotta, JMathur, MMay, MMechin, NMehta, PMeixner, JMelinger, AMiller, JKMiller, MMoore, KMöschl, MMotyl, MMüller, SMMunafo, MNeijenhuijs, KINervi, TNicolas, GNilsonne, GNosek, BANuijten, MBOlsson, COsborne, COstkamp, LPavel, MPenton-Voak, ISPerna, OPernet, CPerugini, MPipitone, RNPitts, MPlessow, FPrenoveau, JMRahal, RMRatliff, KAReinhard, DRenkewitz, FRicker, AARigney, ARivers, AMRoebke, MRutchick, AMRyan, RSSahin, OSaide, ASandstrom, GMSantos, DSaxe, RSchlegelmilch, RSchmidt, KScholz, SSeibel, LSelterman, DFShaki, SSimpson, WBSinclair, HCSkorinko, JLMSlowik, ASnyder, JSSoderberg, CSonnleitner, CSpencer, NSpies, JRSteegen, SStieger, SStrohminger, NSullivan, GBTalhelm, TTapia, MTe Dorsthorst, AThomae, MThomas, SLTio, PTraets, FTsang, STuerlinckx, FTurchan, PValášek, MVan't Veer, AEVan Aert, RVan Assen, MVan Bork, RVan De Ven, MVan Den Bergh, DVan Der Hulst, MVan Dooren, RVan Doorn, JVan Renswoude, DRVan Rijn, HVanpaemel, WEcheverría, AVVazquez, MVelez, NVermue, MVerschoor, MVianello, MVoracek, MVuu, GWagenmakers, EJWeerdmeester, JWelsh, AWestgate, ECWissink, JWood, MWoods, AWright, EWu, SZeelenberg, MZuni, K
2015
Facial Landmark Localization in the Wild by Backbone-Branches Representation Learning
Proceeding/Conference:2018 IEEE Fourth International Conference on Multimedia Big Data (BigMM)
2018
 
2019
 
1-May-2023
 
Fashion Retrieval via Graph Reasoning Networks on a Similarity Pyramid
Journal:IEEE Transactions on Pattern Analysis and Machine Intelligence
2020
 
Fashion retrieval via graph reasoning networks on a similarity pyramid
Proceeding/Conference:IEEE International Conference on Computer Vision (ICCV) Proceedings
2019
 
2019
 
2020