Showing results 1 to 19 of 19
| Title | Author(s) | Issue Date | |
|---|---|---|---|
Activities towards p-type doping of ZnO Proceeding/Conference:Journal of Physics: Conference Series | 2011 | ||
Aluminum and electron-irradiation induced deep-levels in n-type and p-type 6H-SiC Proceeding/Conference:Defect and impurity engineered semiconductors II, Materials Research Society Symposium Proceedings | 1998 | ||
Au/n-ZnO rectifying contacts fabricated with hydrogen peroxide pre-treatment Proceeding/Conference:Materials Research Society Symposium Proceedings | 2007 | ||
Current transport at low temperature in A1/6H-SiC Schottky barriers Proceeding/Conference:Institute of Physics Conference Series No.142: Chapter 4 Paper presented at Silicon Carbide and Related Materials 1995 Conference, Kyoto, Japan | 1996 | ||
Deep level defect study of As-implanted ZnO p-n junction Proceeding/Conference:Wide Band Gap Semiconductor Nanostructures for Optoelectronic Applications,
E-MRS 2008 Spring Meeting, Strasbourg, France, May 26-30, 2008 | 2008 | ||
Deep level defects E1/E2 in n-type 6H silicon carbide induced by electron radiation and He-implantation Proceeding/Conference:AIP Conference Proceedings | 2005 | ||
Deep level defects in 6H silicon carbide induced by particles irradiations Proceeding/Conference:The National Conference of Semiconductor Physics | 2005 | ||
Deep level defects in he-implanted n-6H-SiC studied by deep level transient spectroscopy Proceeding/Conference:Materials Research Society Symposium Proceedings | 2004 | ||
Deep level transient spectroscopic study of nitrogen-implanted ZnO single crystal Proceeding/Conference:International Symposium on Compound Semiconductors, ISCS 2010 | 2010 | ||
Defect study in zinc oxide related structures – Electrical and optical characterization Proceeding/Conference:Materials Research Society (MRS) International Materials Research Conference | 2008 | ||
Defects characterization in ZnO Schottky contact and homogeneous p-n junction Proceeding/Conference:IEEE Nanotechnology Materials and Devices Conference | 2008 | ||
Electrical characterization of N +-implanted n-type ZnO single crystals: p-n homojunction and deep level defects Proceeding/Conference:Materials Research Society Symposium Proceedings | 2008 | ||
Electrical characterization of N+-implanted n-type ZnO single crystal: ZnO p-n homojunction and deep level defects Proceeding/Conference:Materials Research Society (MRS) Fall Meeting & Exhibit | 2007 | ||
Electrical characterizations of deep levels in N+-implanted ZnO single crystal Proceeding/Conference:International Conference on Materials for Advanced Technologies, ICMAT 2007 | 2007 | ||
GaN thin films on SiC substrates studied using variable energy positron annihilation spectroscopy Proceeding/Conference:Materials Science Forum | 2001 | ||
Influence of hydrogen peroxide treatment on Au/n-ZnO contact Proceeding/Conference:The International Conference on Positron Annihilation | 2006 | ||
Non-destructive characterization of vertical ZnO nanorod arrays by slow positron implantation spectroscopy, atomic force microscopy, and photoluminescence Proceeding/Conference:9th International Workshop on Positron and Positronium Chemistry, Wuhan University, China, May 11-15, 2008 | 2008 | ||
Positron annihilation study of hydrothermal grown n-type zinc oxide Proceeding/Conference:The International Conference on Positron Annihilation | 2006 | ||
Scanning probe microscopy-based characterization of ZnO nanorods Proceeding/Conference:INEC 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings | 2010 |