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Conference Paper: Defect study in zinc oxide related structures – Electrical and optical characterization

TitleDefect study in zinc oxide related structures – Electrical and optical characterization
Authors
Gu, QLing, FCCCheung, CKDai, XXu, SJTam, KHDjurisic, AWang, RSOng, HCBrauer, GAnwand, WSkorupa, W
Issue Date2008
Citation
Materials Research Society (MRS) International Materials Research Conference, Chongqing, China, 9-12 June 2008 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/109761

 

DC FieldValueLanguage
dc.contributor.authorGu, Qen_HK
dc.contributor.authorLing, FCCen_HK
dc.contributor.authorCheung, CKen_HK
dc.contributor.authorDai, Xen_HK
dc.contributor.authorXu, SJen_HK
dc.contributor.authorTam, KHen_HK
dc.contributor.authorDjurisic, Aen_HK
dc.contributor.authorWang, RSen_HK
dc.contributor.authorOng, HCen_HK
dc.contributor.authorBrauer, Gen_HK
dc.contributor.authorAnwand, Wen_HK
dc.contributor.authorSkorupa, Wen_HK
dc.date.accessioned2010-09-26T01:36:08Z-
dc.date.available2010-09-26T01:36:08Z-
dc.date.issued2008en_HK
dc.identifier.citationMaterials Research Society (MRS) International Materials Research Conference, Chongqing, China, 9-12 June 2008-
dc.identifier.urihttp://hdl.handle.net/10722/109761-
dc.languageengen_HK
dc.relation.ispartofMaterials Research Society (MRS) International Materials Research Conferenceen_HK
dc.titleDefect study in zinc oxide related structures – Electrical and optical characterizationen_HK
dc.typeConference_Paperen_HK
dc.identifier.emailLing, FCC: ccling@hkucc.hku.hken_HK
dc.identifier.emailXu, SJ: sjxu@hkucc.hku.hken_HK
dc.identifier.emailDjurisic, A: dalek@hkusua.hku.hken_HK
dc.identifier.authorityLing, FCC=rp00747en_HK
dc.identifier.authorityXu, SJ=rp00821en_HK
dc.identifier.authorityDjurisic, A=rp00690en_HK
dc.identifier.hkuros152382en_HK

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