Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
2008
187
 
2005
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2002
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1993
61
 
2009
178
 
1995
140
 
Characterization of optical and structural properties of Pt-Si interface by spectroscopic ellipsometry
Proceeding/Conference:Proceedings of the 22nd International Conference on the Physics of Semiconductors, Canada
1994
97
 
1994
188
 
2010
113
 
2007
140
 
2008
80
 
2006
190
 
2004
184
 
2006
170
 
2009
212
 
2009
184
 
2011
130
 
2012
51
 
2004
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1993
160