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Browsing by Author Sin, JKO
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Showing results 9 to 28 of 30
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Title
Author(s)
Issue Date
High-temperature thermal sensor based on ultra-thin silicon film for ultra-low-power applications
Journal:
Solid-State Electronics
Li, B
Wu, ZH
Lai, PT
Sin, JKO
Liu, BY
Zheng, XR
2003
Improved Charge-Trapping Characteristics of BaTiO3 by Zr Doping for Nonvolatile Memory Applications
Journal:
IEEE Electron Device Letters
Huang, X
Sin, JKO
Lai, PT
2013
Improved Charge-Trapping Characteristics of ZrO2 by Al Doping for Nonvolatile Memory Applications
Journal:
IEEE Transactions on Device and Materials Reliability
HUANG, X
SHI, R
Sin, JKO
Lai, PT
2016
Improved reliability for gate dielectric of low-temperature polysilicon thin-film transistors by NO-plasma nitridation
Journal:
Solid-State Electronics
Or, DCT
Lai, PT
Sin, JKO
Xu, JP
2003
Latch-up characteristics of a trench-gate conductivity modulated power transistor
Proceeding/Conference:
IEEE Region International Conference on Microelectronics and VLSI Proceedings
Jun, C
Sin, JKO
Ng, WT
Lai, PT
1995
LaTiON/LaON as band-engineered charge-trapping layer for nonvolatile memory applications
Journal:
Applied Physics A: Materials Science and Processing
Huang, XD
Lai, PT
Sin, JKO
2012
Nb-doped Ga2O3 as charge-trapping layer for nonvolatile memory applications
Journal:
Microelectronics Reliability
SHI, R
Huang, XD
Sin, JKO
Lai, PT
2016
Nb-doped Gd2O3 as charge-trapping layer for nonvolatile memory applications
Journal:
Applied Physics Letters
SHI, R
HUANG, X
Sin, JKO
Lai, PT
2015
Nb-Doped La2O3 as Charge-Trapping Layer for Nonvolatile Memory Applications
Journal:
IEEE Transactions on Device and Materials Reliability
Shi, RP
Huang, XD
Leung, CH
Sin, JKO
Lai, PT
2015
A new high-temperature thermal sensor based on large-grain polysilicon on insulator
Journal:
Sensors and Actuators, A: Physical
Wu, ZH
Lai, PT
Sin, JKO
2006
A new lateral trench-gate conductivity modulated power transistor
Journal:
IEEE Transactions on Electron Devices
Cai, J
Sin, JKO
Mok, PKT
Ng, WT
Lai, PT
1999
Nitrided La2O3 as charge-trapping layer for nonvolatile memory applications
Journal:
IEEE Transactions on Device and Materials Reliability
Huang, XD
Sin, JKO
Lai, PT
2012
Novel silicon-embedded coreless transformer for on-chip isolated signal transfer
Journal:
IEEE Magnetics Letters
Wu, R
Sin, JKO
Hui, SY
2011
Optimization of plasma nitridation for reliability enhancement of low-temperature gate dielectric in MOS devices
Journal:
Solid-State Electronics
Or, DCT
Lai, PT
Sin, JKO
2003
Optimization of silicon Spreading-Resistance Temperature sensor
Proceeding/Conference:
Proceedings of the IEEE Hong Kong Electron Devices Meeting
Li, Bin
Lai, PT
Chan, CL
Sin, JKO
2000
Performance of nonvolatile memory by using band-engineered SrTiO 3/HfON stack as charge-trapping layer
Journal:
Microelectronics Reliability
Huang, XD
Lai, PT
Sin, JKO
2012
Reset-sensing quasi-V2 single-inductor multiple-output buck converter with reduced cross-regulation
Proceeding/Conference:
IEEE Applied Power Electronics Conference and Exposition Conference Proceedings
Lee, ATL
Tan, SC
Hui, SYR
Chan, PCH
Sin, JKO
2015
Scalability of Quasi-hysteretic FSM-based Digitally Controlled Single-inductor Dual-string Buck LED Driver To Multiple Strings
Journal:
IEEE Transactions on Power Electronics
Lee, ATL
Sin, JKO
Chan, PCH
2014
Spreading-resistance temperature sensor on silicon-on-insulator
Journal:
IEEE Electron Device Letters
Lai, PT
Li, B
Chan, CL
Sin, JKO
1999
Spreading-resistance temperature sensor on thin-film SOI
Proceeding/Conference:
Proceedings of the IEEE Hong Kong Electron Devices Meeting
Li, B
Lai, PT
Sin, JKO
2001