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Browsing by Author HUANG, XD
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Showing results 14 to 31 of 31
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Title
Author(s)
Issue Date
Views
Improved Charge-Trapping Performance of Hf-Doped SrTiO3 for Nonvolatile Memory Applications
Proceeding/Conference:
ECS Transactions
Huang, XD
Lai, PT
2015
70
Improved charge-trapping properties of HfYON film for nonvolatile memory applications in comparison with HfON and Y 2O 3 films
Journal:
Applied Physics Letters
Huang, XD
Liu, L
Xu, JP
Lai, PT
2011
178
Improved performance by using TaON/SiO2 as dual tunnel layer in Charge-Trapping nonvolatile memory
Journal:
Microelectronics Reliability
Chen, JX
Xu, JP
Liu, L
Huang, XD
Lai, PT
2014
47
Improved Performance of Scaled-Down α -InGaZnO Thin-Film Transistor by Ar Plasma Treatment
Journal:
IEEE Electron Device Letters
Huang, XD
SONG, J
Lai, PT
2016
38
Improved performance of yttrium-doped Al2O3 as inter-poly dielectric for flash-memory applications
Journal:
IEEE Transactions on Device and Materials Reliability
Huang, XD
Liu, L
Xu, JP
Lai, PT
2011
208
Improved Stability of α -InGaZnO Thin-Film Transistor under Positive Gate Bias Stress by Using Fluorine Plasma Treatment
Journal:
IEEE Electron Device Letters
Huang, XD
SONG, J
Lai, PT
2017
36
Improvements of Performance and Reliability for Metal–Oxide–Nitride–Oxide–Silicon Flash Memory With NO- or N2O-Grown Oxynitride as Tunnel Layer
Journal:
IEEE Transactions on Device and Materials Reliability
Chen, JX
Xu, JP
Liu, L
HUANG, XD
Lai, PT
Xu, HX
2014
15
LaTiON/LaON as band-engineered charge-trapping layer for nonvolatile memory applications
Journal:
Applied Physics A: Materials Science and Processing
Huang, XD
Lai, PT
Sin, JKO
2012
247
Lycium barbarum polysaccharide-glycoprotein preventative treatment ameliorates aversive
Journal:
Neural Regeneration Research
Fu, YW
Peng, YF
Huang, XD
Yang, Y
Huang, L
Xi, Y
Hu, ZF
Lin, S
So, KF
Ren, CR
2021
46
Nb-doped Ga2O3 as charge-trapping layer for nonvolatile memory applications
Journal:
Microelectronics Reliability
SHI, R
Huang, XD
Sin, JKO
Lai, PT
2016
61
Nb-Doped La2O3 as Charge-Trapping Layer for Nonvolatile Memory Applications
Journal:
IEEE Transactions on Device and Materials Reliability
Shi, RP
Huang, XD
Leung, CH
Sin, JKO
Lai, PT
2015
39
Nitrided La2O3 as charge-trapping layer for nonvolatile memory applications
Journal:
IEEE Transactions on Device and Materials Reliability
Huang, XD
Sin, JKO
Lai, PT
2012
148
Nitrided SrTiO 3 as charge-trapping layer for nonvolatile memory applications
Journal:
Applied Physics Letters
Huang, XD
Lai, PT
Liu, L
Xu, JP
2011
216
A novel MONOS memory with high-κ HfLaON as charge-storage layer
Journal:
IEEE Transactions on Device and Materials Reliability
Liu, L
Xu, JP
Ji, F
Huang, XD
Lai, PT
2011
197
Performance of nonvolatile memory by using band-engineered SrTiO 3/HfON stack as charge-trapping layer
Journal:
Microelectronics Reliability
Huang, XD
Lai, PT
Sin, JKO
2012
114
Thermal and electrical characteristics of HfLaON with different nitridation annealings
Proceeding/Conference:
ICSICT-2010 - 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology, Proceedings
Huang, XD
Lai, PT
2010
107
Y-Doped BaTiO3 as a Charge-Trapping Layer for Nonvolatile Memory Applications
Journal:
IEEE Electron Device Letters
SHI, R
Huang, XD
Sin, JKO
Lai, PT
2016
74
YAlO x as inter-poly delectric for improved performance of flash-memory application
Proceeding/Conference:
2010 IEEE International Conference of Electron Devices and Solid-State Circuits, EDSSC 2010
Huang, XD
Lai, PT
2010
114
