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Showing results 1 to 9 of 9

	Title	Author(s)	Issue Date
	Candida tropicalis fungaemia in adult patients with haematological malignancies: Clinical features and risk factors Journal:Journal of Hospital Infection	Leung, AYH Chim, CS Ho, PL Cheng, CC Yuen, KY Lie, AKW Au, WY Liang, R Kwong, YL	2002
	Early detection of hepatocellular carcinoma increases the chance of treatment: Hong kong experience Journal:Hepatology	Yuen, MF Cheng, CC Lauder, IJ Lam, SK Ooi, CGC Lai, CL	2000
	Long-term follow-up of interferon alfa treatment in Chinese patients with chronic hepatitis B infection: The effect on hepatitis B e antigen seroconversion and the development of cirrhosis-related complications Journal:Hepatology	Yuen, MF Hui, CK Cheng, CC Wu, CH Lai, YP Lai, CL	2001
	A novel design for a variable energy positron lifetime spectrometer Journal:Applied Surface Science	Chen, D Zhang, JD Cheng, CC Beling, CD Fung, S	2008
	Optical and microstructural characterization of porous silicon using photoluminescence, SEM and positron annihilation spectroscopy Journal:Journal of Physics Condensed Matter	Cheung, CK Nahid, F Cheng, CC Beling, CD Fung, S Ling, CC Djurisić, AB Pramanik, C Saha, H Sarkar, CK	2007
	Pinning-Free Edge Contact Monolayer MoS2 FET Proceeding/Conference:International Electron Devices Meeting (IEDM)	Hung, TYT Wang, SY Chuu, CP Chung, YY Chou, AS Huang, FS Chen, T Li, MY Cheng, CC Cai, J Chien, CH Chang, WH Wong, HSP Li, LJ	2020
	Reliability of Ultrathin High-κ Dielectrics on Chemical-vapor Deposited 2D Semiconductors Proceeding/Conference:International Electron Devices Meeting (IEDM)	Yu, Z Ning, H Cheng, CC Li, W Liu, L Meng, W Luo, Z Li, T Cai, S Wang, P Chang, WH Chien, CH Shi, Y Xu, Y Li, LJ Wang, X	2020
	Silicon and carbon vacancies in silicon carbide studied by coincidence Doppler broadening spectroscopy Journal:Physica Status Solidi (C) Current Topics in Solid State Physics	Zhang, JD Cheng, CC Ling, CC Beling, CD Fung, S	2007
	Switchable NAND and NOR Logic Computing in Single Triple-Gate Monolayer MoS2 n-FET Proceeding/Conference:International Electron Devices Meeting (IEDM)	Chung, YY Cheng, CC Kang, BK Chueh, WC Wang, SY Chou, CH Hung, TYT Wang, SY Chang, WH Li, LJ Chien, CH	2020

Showing results 1 to 9 of 9