Browsing by Author Tse, MS

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Showing results 9 to 16 of 16 < previous 
TitleAuthor(s)Issue DateViews
 
2001
66
 
2001
63
 
Post-breakdown conduction instability of ultrathin SiO 2 films observed in ramped-current and ramped-voltage current-voltage measurements
Journal:Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
2002
62
 
2004
117
 
2005
107
 
1994
141
 
2001
98
 
2006
102