Showing results 11 to 16 of 16
< previous
Title | Author(s) | Issue Date | |
---|---|---|---|
Quality improvement of low-pressure chemical-vapor-deposited oxide by N2O nitridation Journal:Applied Physics Letters | 1997 | ||
A reliability comparison of InGaP/GaAs HBTs with and without passivation ledge Journal:Microelectronics Reliability | 2001 | ||
1997 | |||
Suppression of hot-carrier-induced degradation in n-MOSFETS at low temperatures by N 2O-nitridation of gate oxide Journal:Solid-State Electronics | 1998 | ||
Temperature dependence of current gain of GalnP/GaAs heteroj unction and heterostructure-emitter bipolar transistors Journal:IEEE Transactions on Electron Devices | 1999 | ||
Thermal effect on current gains of an AlGaAs/GaAs heterostructure-emitter bipolar transistor Journal:Applied Physics Letters | 1999 |