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Browsing "Department of Electrical & Electronic Engineering" by Author xu, jp
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Showing results 1 to 20 of 57
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Title
Author(s)
Issue Date
A 2-D analytical threshold-voltage model for GeOI/GeON MOSFET with high-k gate dielectric
Journal:
Microelectronics Reliability
JI, F
XU, JP
LIU, L
TANG, WM
Lai, PT
2016
Comparative study of high-K HfLaON and HfON as charge-storage layer of MONOS memory
Proceeding/Conference:
2010 IEEE International Conference of Electron Devices and Solid-State Circuits, EDSSC 2010
Liu, L
Xu, JP
Huang, XD
Ji, F
Lai, PT
2010
A comparison of MISiC Schottky-diode hydrogen sensors made by NO, N 2O, or NH 3 nitridations
Journal:
IEEE Transactions on Electron Devices
Tang, WM
Lai, PT
Leung, CH
Xu, JP
2006
Correlation between hot-carrier-induced interface states and GIDL current increase in N-MOSFET's
Journal:
IEEE Transactions on Electron Devices
Lai, PT
Xu, JP
Wong, WM
Lo, HB
Cheng, YC
1998
Effective passivation of HfO2/Ge interface by using nitrided germanate as passivation interlayer
Journal:
physica status solidi (a)
Cheng, ZX
Xu, JP
Liu, L
Huang, Y
Lai, PT
Tang, WM
2017
Effects of annealing gas on electrical properties and reliability of Ge MOS capacitors with HfTiON as gate dielectric
Proceeding/Conference:
IEEE Conference on Electron Devices and Solid-State Circuits 2007, EDSSC 2007
Li, CX
Lai, PT
Xu, JP
Zou, X
2007
Effects of annealing on electrical performance of multilayer MoS2 transistors with atomic layer deposited HfO2 gate dielectric
Journal:
Applied Physics Express
Wen, M
Xu, JP
Liu, L
Lai, PT
Tang, WM
2016
Effects of annealing temperature and gas on pentacene OTFTs with HfLaO as gate dielectric
Journal:
IEEE Transactions on Device and Materials Reliability
Deng, LF
Liu, YR
Choi, HW
Xu, JP
Che, CM
Lai, PT
2012
Effects of chlorine on interfacial properties and reliability of SiO 2 grown on 6H-SiC
Journal:
Applied Physics A: Materials Science and Processing
Xu, JP
Lai, PT
Wu, HP
Chan, CL
2005
Effects of different annealing gases on pentacene OTFT with HfLaO gate dielectric
Proceeding/Conference:
IEEE Electron Device Letters
Deng, LF
Lai, PT
Chen, WB
Xu, JP
Liu, YR
Choi, HW
Che, CM
2011
Effects of gate-insulator nitridation gas on MISiC Schottky-diode hydrogen sensors
Proceeding/Conference:
2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC
Tang, WM
Leung, CH
Lai, PT
Xu, JP
2006
Effects of trapped charges in gate dielectric and high- k encapsulation on performance of MoS2 transistor
Journal:
IEEE Transactions on Electron Devices
XU, JP
XIE, WX
LIU, L
ZHAO, X
SONG, X
Lai, PT
TANG, WM
2019
Effects of Y incorporation in TaON gate dielectric on electrical performance of GaAs metal-oxide-semiconductor capacitor
Journal:
Physica Status Solidi - Rapid Research Letters
Liu, LN
Choi, HW
Xu, JP
Lai, PT
2016
Electrical and Interfacial Properties of GaAs MOS Capacitors With La-Doped ZrON as Interfacial Passivation Layer
Journal:
IEEE Transactions on Electron Devices
Lu, HH
Xu, JP
Liu, L
Lai, PT
Tang, WM
2017
Electrical characteristics of Al-doped ZnO-channel thin-film transistor with high-κ HfON/SiO 2 stack gate dielectric
Proceeding/Conference:
2010 IEEE International Conference of Electron Devices and Solid-State Circuits, EDSSC 2010
Zou, X
Xu, JP
Lai, PT
Li, Y
Ji, F
Deng, LF
2010
Electrical properties of different NO-annealed oxynitrides
Proceeding/Conference:
Journal of Non-Crystalline Solids
Xu, JP
Lai, PT
Cheng, YC
1999
Electrical properties of HfTiO gate-dielectric metal oxide semiconductor capacitors with NO and N 2O surface nitridations
Proceeding/Conference:
2010 IEEE International Conference of Electron Devices and Solid-State Circuits, EDSSC 2010
Ji, F
Xu, JP
Li, CX
Lai, PT
Deng, LF
Zou, X
2010
Electricalperformance of multilayer MoS2 transistor with ALD HfTiO gate dielectric
Proceeding/Conference:
IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)
Wen, M
Xu, JP
Liu, L
Huang, Y
Lai, PT
Tang, WM
2016
Enhanced hydrogen-sensing characteristics of MISiC Schottky-diode hydrogen sensor by trichloroethylene oxidation
Journal:
Sensors and Actuators, A: Physical
Tang, WM
Lai, PT
Xu, JP
Chan, CL
2005
Fabrication and electrical performance of CVD-grown MoS2 transistor
Proceeding/Conference:
IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)
Wen, M
Xu, JP
Liu, L
Zhao, X
Lai, PT
Tang, WM
2017