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Browsing "Department of Electrical & Electronic Engineering" by Author shi, r
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Showing results 1 to 12 of 12
Title
Author(s)
Issue Date
A Real-time Coprime Line Scan Super-resolution System for Ultra-fast Microscopy
Journal:
IEEE Transactions on Biomedical Circuits and Systems
Shi, R
Wong, JSJ
Lam, EY
Tsia, KK
So, HKH
2019
CSB-RNN: A Faster-than-Realtime RNN Acceleration Framework with Compressed Structured Blocks
Proceeding/Conference:
Proceedings of the 34th ACM International Conference on Supercomputing (ICS 2020)
Shi, R
Dong, P
Geng, T
Ding, Y
Ma, X
So, HKH
Herbordt, M
Li, A
Wang, Y
2020
Dynamic Sparse Training: Find Efficient Sparse Network From Scratch With Trainable Masked Layers
Proceeding/Conference:
International Conference on Learning Representations (ICLR)
Liu, J
Xu, Z
Shi, R
Cheung, RCC
So, HKH
2020
E-LSTM: Efficient Inference of Sparse LSTM on Embedded Heterogeneous System
Proceeding/Conference:
Proceedings of the 56th Annual Design Automation Conference 2019 (DAC '19)
Shi, R
Liu, J
So, HKH
Wang, S
Liang, Y
2019
FTDL: A Tailored FPGA-Overlay for Deep Learning with High Scalability
Proceeding/Conference:
ACM/IEEE Design Automation Conference Proceedings
Shi, R
Ding, Y
Wei, X
Li, H
Liu, H
So, HKH
Ding, C
2020
FTDL: An FPGA-tailored Architecture for Deep Learning Systems
Proceeding/Conference:
The 2020 ACM/SIGDA International Symposium on Field-Programmable Gate Arrays
Shi, R
Ding, Y
Wei, X
Liu, H
So, HKH
Ding, C
2020
High-Throughput Line Buffer Microarchitecture for Arbitrary Sized Streaming Image Processing
Journal:
Journal of Imaging
SHI, R
Wong, JS
So, HKH
2019
Improved Charge-Trapping Characteristics of ZrO2 by Al Doping for Nonvolatile Memory Applications
Journal:
IEEE Transactions on Device and Materials Reliability
HUANG, X
SHI, R
Sin, JKO
Lai, PT
2016
Mix and Match: A Novel FPGA-Centric Deep Neural Network Quantization Framework
Proceeding/Conference:
Proceedings: 27th IEEE International Symposium on High-Performance Computer Architecture, 27 February-3 March 2021
Chang, SE
Li, Y
Sun, M
Shi, R
So, HKH
Qian, X
Wang, Y
Lin, X
2021
Nb-doped Ga2O3 as charge-trapping layer for nonvolatile memory applications
Journal:
Microelectronics Reliability
SHI, R
Huang, XD
Sin, JKO
Lai, PT
2016
Nb-doped Gd2O3 as charge-trapping layer for nonvolatile memory applications
Journal:
Applied Physics Letters
SHI, R
HUANG, X
Sin, JKO
Lai, PT
2015
Y-Doped BaTiO3 as a Charge-Trapping Layer for Nonvolatile Memory Applications
Journal:
IEEE Electron Device Letters
SHI, R
Huang, XD
Sin, JKO
Lai, PT
2016
