Showing results 1 to 5 of 5
Title | Author(s) | Issue Date | |
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3-D statistical simulation comparison of oxide reliability of planar MOSFETs and FinFET Journal:IEEE Transactions on Electron Devices | 2013 | ||
3D dynamic RTN simulation of a 25nm MOSFET: The importance of variability in reliability evaluation of decananometer devices Proceeding/Conference:2012 15th International Workshop on Computational Electronics, IWCE 2012 | 2012 | ||
Impact of statistical variability and 3D electrostatics on post-cycling anomalous charge loss in nanoscale Flash memories Proceeding/Conference:IEEE International Reliability Physics Symposium Proceedings | 2013 | ||
RTN and BTI in nanoscale MOSFETs: A comprehensive statistical simulation study Journal:Solid-State Electronics | 2013 | ||
Statistical interactions of multiple oxide traps under BTI stress of nanoscale MOSFETs Journal:IEEE Electron Device Letters | 2013 |