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Showing results 111 to 130 of 639 < previous next >

Title	Author(s)	Issue Date
Deep level defects study of arsenic implanted ZnO single crystal	Zhu, Congyong.朱從佣. Advisor(s):Ling, FCC	2008
Deep level transient spectroscopic study of intrinsic defects in particle-irradiated ZnO single crystal materials	Lu, Xiaohong 吕小红	2012
Deep level transient spectroscopic study of nitrogen-implanted ZnO single crystal	Ding, Guangwei 丁光炜 Advisor(s):Ling, FCC	2010
Deep level transient spectroscopy studies of gallium arsenide and silicon carbide	Chavva, Venkataramana Reddy.	1997
Defect emission of ZnO and its related origins	Wang, Zilan 王子蘭	2014
Defect sensitivity and resolvability limits in positron-lifetime spectroscopy	Chin, Hong-yu.錢匡裕	2001
Defect studies of single crystal and thin film zinc oxide by positron annihilation spectroscopy and cathodoluminescence	To, Chun-kit.杜俊傑. Advisor(s):Fung, SHY	2010
Defect study of N-type 6H silicon carbide using positron lifetime spectroscopy	Lam, Chi-hung 林志雄 Advisor(s):Ling, FCC Fung, SHY	2002
Defect study of zinc oxide bulk materials by positron lifetime spectroscopy	So, Chun-keung.蘇振強 Advisor(s):Ling, FCC	2008
Defects and doping in transition-metal dichalcogenide thin films grown by molecular-beam epitaxy	Xia, Yipu 夏驛璞 Advisor(s):Xie, MH	2020
Defects mediated functionalization of ZnO based materials	Azeem, Waqar Advisor(s):Ling, FCC	2018
Design and implementation of a fully automated real-time s-parameter imaging system	Naik, Pranab Sabitru. Advisor(s):Fung, SHY Beling, CD	2004
Detector noise reduction in positron doppler broadening related spectroscopy systems	Ching, Hei-man, Anita.程曦敏	2002
Determination of atomic structure of Co/GaN(0001) surface by using LEED Patterson inversion and tensor LEED fitting	Li, Hiu-lung.李曉隆. Advisor(s):Wu, HS	2011
Determination of surface atomic structures of Bi₂Se₃(111)-(2X2) film and ZnO nano-rods by low energy electron diffraction	Chung, Wing-lun 鍾詠麟	2014
Determination of the absolute intensities of cosmic-ray muons at sea level	Lau, Shun-yin.劉愼言	1973
Determine the atomic structure of a surface with mixed structure phases by using LEED Patterson function	Tsang, Wai-kan.曾衛勤. Advisor(s):Wu, HS	2004
Development of a deep level optical spectroscopy system and its application to the study of defects in electron and neutron irradiatedgallium nitride	Li, Stella.李加碧.	2003
Development of a deep level transient spectrometer and some deep levelstudies of Gallium Arsenide	Chavva, Venkataramana Reddy.	1993
Development of optimized deconvoluted coincidence doppler broadening spectroscopy and deep level transient spectroscopies with applicationsto various semiconductor materials	Zhang, Jingdong.張敬東. Advisor(s):Fung, SHY Beling, CD	2006

Showing results 111 to 130 of 639 < previous next >