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postgraduate thesis: Deep level defects study of arsenic implanted ZnO single crystal

TitleDeep level defects study of arsenic implanted ZnO single crystal
Authors
Advisors
Advisor(s):Ling, FCC
Issue Date2008
PublisherThe University of Hong Kong (Pokfulam, Hong Kong)
Citation
Zhu, C. [朱從佣]. (2008). Deep level defects study of arsenic implanted ZnO single crystal. (Thesis). University of Hong Kong, Pokfulam, Hong Kong SAR. Retrieved from http://dx.doi.org/10.5353/th_b4098775
DegreeMaster of Philosophy
SubjectZinc oxide.
Arsenic.
Doped semiconductors.
Semiconductors - Defects.
Deep level transient spectroscopy.
Dept/ProgramPhysics
Persistent Identifierhttp://hdl.handle.net/10722/52363
HKU Library Item IDb4098775

 

DC FieldValueLanguage
dc.contributor.advisorLing, FCC-
dc.contributor.authorZhu, Congyong.-
dc.contributor.author朱從佣.-
dc.date.issued2008-
dc.identifier.citationZhu, C. [朱從佣]. (2008). Deep level defects study of arsenic implanted ZnO single crystal. (Thesis). University of Hong Kong, Pokfulam, Hong Kong SAR. Retrieved from http://dx.doi.org/10.5353/th_b4098775-
dc.identifier.urihttp://hdl.handle.net/10722/52363-
dc.languageeng-
dc.publisherThe University of Hong Kong (Pokfulam, Hong Kong)-
dc.relation.ispartofHKU Theses Online (HKUTO)-
dc.rightsThe author retains all proprietary rights, (such as patent rights) and the right to use in future works.-
dc.rightsThis work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.-
dc.source.urihttp://hub.hku.hk/bib/B40987759-
dc.subject.lcshZinc oxide.-
dc.subject.lcshArsenic.-
dc.subject.lcshDoped semiconductors.-
dc.subject.lcshSemiconductors - Defects.-
dc.subject.lcshDeep level transient spectroscopy.-
dc.titleDeep level defects study of arsenic implanted ZnO single crystal-
dc.typePG_Thesis-
dc.identifier.hkulb4098775-
dc.description.thesisnameMaster of Philosophy-
dc.description.thesislevelMaster-
dc.description.thesisdisciplinePhysics-
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.5353/th_b4098775-
dc.date.hkucongregation2008-
dc.identifier.mmsid991024192179703414-

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