Showing results 3 to 7 of 7
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Title | Author(s) | Issue Date | Views | |
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Depth profiling of charging effect of Si nanocrystals embedded in SiO2: A study of charge diffusion among Si nanocrystals Journal:Journal of Physical Chemistry B | 2006 | 186 | ||
Depth Profiling of Si Oxidation States in Si-Implanted SiO 2 Films by X-Ray Photoelectron Spectroscopy Journal:Japanese Journal of Applied Physics, Part 2: Letters | 2003 | 81 | ||
How Local Information Improves Rendezvous in Cognitive Radio Networks Proceeding/Conference:IEEE International Conference on Sensing, Communication, and Networking (SECON) | 2018 | 54 | ||
Memory effect of Al-rich AlN films synthesized with rf magnetron sputtering Journal:Applied Physics Letters | 2005 | 147 | ||
2005 | 193 |