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Browsing "Department of Electrical & Electronic Engineering" by Author ma, zj
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Showing results 1 to 14 of 14
Title
Author(s)
Issue Date
Views
Characterisation and simulation of substrate current in thermally reoxidised-nitrided-oxide n-MOSFET's
Proceeding/Conference:
International Semiconductor Device Research Symposium, ISDRS-91
Ma, ZJ
Lai, PT
Liu, ZH
Cheng, YC
1991
44
Deep-depletion-layer impact-ionization-induced gate-oxide breakdown in thin-oxide n-MOSFETs
Journal:
Solid-State Electronics
Huang, MQ
Lai, PT
Ma, ZJ
Wong, H
Cheng, YC
1993
Effects of hole trapping on degradation behaviors in thermally-nitrided oxides under F-N injection
Proceeding/Conference:
Proceedings of the 3rd International Conference on Solid State and Integrated Circuit Technology
Lai, PT
Ma, ZJ
Cheng, YC
Liu, BY
Huang, MQ
1992
38
Effects of nitridation and re-oxidation on drain leakage current in n-channel MOSFETs
Proceeding/Conference:
Conference on Solid State Devices and Materials
Fleischer, S
Liu, ZH
Lai, PT
Ma, ZJ
Cheng, YC
1990
Electrical characterization and simulation of substrate current in n-MOSFETs with nitrided/reoxidized-nitrided oxides as gate dielectrics
Journal:
Solid-State Electronics
Ma, ZJ
Lai, PT
Cheng, YC
1992
172
Hot-carrier-induced degradation in reoxidized-nitrided-oxide n-MOSFET's under mixed AC-DC stressing
Journal:
Electron device letters
Ma, ZJ
Lai, PT
Cheng, YC
1992
105
Impact of nitridation/reoxidation on performance degradation in n-MOSFETs under Fowler-Nordheim injection
Journal:
Solid-State Electronics
Ma, ZJ
Liu, ZH
Lai, PT
Fleischer, S
Cheng, YC
1992
159
Improvement of channel-current-induced gate-oxide breakdown in n-MOSFET's using rapid thermal nitridation
Proceeding/Conference:
Proceedings of the 3rd International Conference on Solid State and Integrated Circuit Technology
Huang, MQ
Lai, PT
Ma, ZJ
Cheng, YC
Liu, BY
1992
Improvement of punchthrough-induced gate-oxide breakdown in n-channel metal-oxide-semiconductor field-effect transistors using rapid thermal nitridation
Journal:
Applied Physics Letters
Huang, MQ
Lai, PT
Ma, ZJ
Wong, H
Cheng, YC
1992
Instability in GIDL current of thermally-nitrided-oxide n-MOSFET's
Proceeding/Conference:
International Conference on VLSI and CAD Proceedings
Ma, ZJ
Lai, PT
Cheng, YC
Huang, MQ
1991
41
Off-state instabilities in thermally nitrided-oxide n-MOSFETs
Journal:
IEEE Transactions on Electron Devices
Ma, ZJ
Lai, PT
Cheng, YC
1993
56
On recovery of hot-carrier-induced mobility degradationin off-state thermally-nitrided-oxide N-MOSFET's
Proceeding/Conference:
Proceedings of the 3rd International Conference on Solid State and Integrated Circuit Technology
Ma, ZJ
Lai, PT
Huang, MQ
Cheng, YC
Liu, BY
1992
39
Oxide-trap-induced instability in GIDL of thermally nitrided-oxide N-MOSFET's under stress
Journal:
Electron device letters
Ma, ZJ
Lai, Pui T
Cheng, YC
1992
111
Tunneling-injection-induced turnaround behavior of threshold voltage in thermally nitrided oxide n-channel metal-oxide-semiconductor field-effect transistors
Journal:
Journal of Applied Physics
Ma, ZJ
Lai, PT
Liu, ZH
Fleischer, S
Cheng, YC
1990
205