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Browsing "Department of Electrical & Electronic Engineering" by Author huang, l
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Showing results 1 to 13 of 13
Title
Author(s)
Issue Date
Views
A multi-layer market for vehicle-to-grid energy trading in the smart grid
Proceeding/Conference:
IEEE Infocom Proceedings
Lam, AYS
Huang, L
Silva, A
Saad, W
2012
52
Acupuncture MRI
Proceeding/Conference:
The first fMRI technology and application conference, Beijing, China
Li, G
Wong, K
Huang, L
Cao, G
Shen, GG
Yang, ES
Ma, Q
2000
140
Comparison of Sensory Cortex Activities Induced by Puncturing Acupoints vs. Non-Acupoints Using fMRI
Proceeding/Conference:
World Congress on Neuroinformatics
Li, G
Wong, KKK
Huang, L
Liu, SR
Cao, G
Shen, GG
Ma, Q
Yang, ES
2001
161
A functional MRI study of activation pattern of somatosensory cortex due to electrical stimulation of acupoints relevant to acupuncture treatment of limb paralysis
Proceeding/Conference:
World Congress Neuroinformatics
Li, G
Wong, KKK
Cheung, RTF
Huang, L
Liu, SR
Cao, G
Shen, GG
Ma, Q
Yang, ES
2001
95
A Functional Mri Study Of Activation Pattern Of Somatosensory Cortex Due To Electrical Stimulation Of Acupoints Relevant To Acupuncture Treatment Of Limb Paralysis
Journal:
MRI New Technology & Comparative Imaging Modalities
Li, G
Wong, KKK
Cheung, RTF
Huang, L
Liu, SR
Cao, G
Shen, GG
Ma, Q
Yang, ES
2005
104
Greatly suppressed stress-induced shift of gate-induced drain leakage in N20-based n-MOSFET's
Journal:
Solid-State Electronics
Xu, J
Lai, PT
Huang, L
Lo, SHB
Cheng, YC
1999
157
Greatly suppressed stress-induced shift of GIDL in N 2O-based n-MOSFET's
Journal:
Solid-State Electronics
Xu, JP
Lai, PT
Huang, L
Lo, HB
Cheng, YC
1998
104
Mechanism analysis of gate-induced drain leakage in off-state n-MOSFET
Proceeding/Conference:
Proceedings of the IEEE Hong Kong Electron Devices Meeting
Huang, L
Lai, PT
Xu, JP
Cheng, YC
1997
109
Mechanism analysis of gate-induced drain leakage in off-state n-MOSFET
Journal:
Microelectronics Reliability
Huang, L
Lai, PT
Xu, JP
Cheng, YC
1998
103
Mechanisms of gate-induced drain leakage in n-MOSFET's
Journal:
Microelectronics Reliability
Huang, L
Lai, PT
Xu, JP
Cheng, YC
1998
105
Melatonin reduced volume of cerebral infarct induced by photothrombosis in wild-type mice, not in Cyclooxygenase-1 gene knockout mice
Proceeding/Conference:
Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings
Zou, LY
Liu, SR
Li, G
Huang, L
Yang, ES
2004
224
Suppression of hot-carrier-induced degradation in n-MOSFETS at low temperatures by N 2O-nitridation of gate oxide
Journal:
Solid-State Electronics
Lai, PT
Xu, JP
Huang, L
Lo, HB
Cheng, YC
1998
119
Use of functional MRI to evaluate correlation between acupoints and the somatic sensory cortex activities
Proceeding/Conference:
International Society for Magnetic Resonance in Medicine Scientific Meeting & Exhibition
Li, G
Wong, KK
Huang, L
Liu, SR
Cao, G
Shen, GG
Yang, ES
Ma, Q
2001
102